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Akimitsu Shimamura
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Kyoto, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Standard cell, standard cell library, semiconductor device, and pla...
Patent number
7,302,660
Issue date
Nov 27, 2007
Matsushita Electric Industrial Co., Ltd.
Akimitsu Shimamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of testing semiconductor apparatus
Patent number
7,290,183
Issue date
Oct 30, 2007
Matsushita Electric Industrial Co., Ltd.
Akimitsu Shimamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor integrated circuit device and method for designing th...
Patent number
7,205,684
Issue date
Apr 17, 2007
Matsushita Electric Industrial Co., Ltd.
Ryota Nishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor apparatus
Patent number
7,188,287
Issue date
Mar 6, 2007
Matsushita Electric Industrial Co., Ltd.
Genichiro Matsuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor device
Patent number
7,178,012
Issue date
Feb 13, 2007
Matsushita Electric Industrial Co., Ltd.
Akimitsu Shimamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Computer system employing pipeline operation
Patent number
6,996,701
Issue date
Feb 7, 2006
Matsushita Electric Industrial Co., Ltd.
Akimitsu Shimamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit and testing method for integrated circuit
Patent number
6,978,409
Issue date
Dec 20, 2005
Matsushita Electric Industrial Co., Ltd.
Takayuki Matsubara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Standard cell, standard cell library, semiconductor device, and pla...
Publication number
20060138464
Publication date
Jun 29, 2006
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Akimitsu Shimamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Path delay test method
Publication number
20050235177
Publication date
Oct 20, 2005
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Yasushi Ohara
G01 - MEASURING TESTING
Information
Patent Application
Method of testing semiconductor apparatus
Publication number
20050055611
Publication date
Mar 10, 2005
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Akimitsu Shimamura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit
Publication number
20040246035
Publication date
Dec 9, 2004
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Koji Karatani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor apparatus
Publication number
20040216021
Publication date
Oct 28, 2004
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Genichiro Matsuda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Semiconductor integrated circuit device and method for designing th...
Publication number
20040094820
Publication date
May 20, 2004
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Ryota Nishikawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integrated circuit and testing method for integrated circuit
Publication number
20020170008
Publication date
Nov 14, 2002
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Takayuki Matsubara
G01 - MEASURING TESTING
Information
Patent Application
Computer system
Publication number
20020038418
Publication date
Mar 28, 2002
MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
Akimitsu Shimamura
G06 - COMPUTING CALCULATING COUNTING