Akinao FUJITA

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Bubble detection in an automated analysis device
- Patent number 11,971,427
- Issue date Apr 30, 2024
- HITACHI HIGH-TECH CORPORATION
- Akinao Fujita
- G01 - MEASURING TESTING
Information Patent Grant
Bubble detection in an automated analysis device
- Patent number 11,933,803
- Issue date Mar 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Akinao Fujita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20220283195
- Publication date Sep 8, 2022
- HITACHI HIGH-TECH CORPORATION
- Hiromi HIRAMA
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED ANALYSIS DEVICE
- Publication number 20220120774
- Publication date Apr 21, 2022
- HITACHI HIGH-TECH CORPORATION
- Akinao FUJITA
- G01 - MEASURING TESTING