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last 30 patents
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Patent Grant
Charged particle beam device for moving an aperture having pluralit...
Patent number
10,636,621
Issue date
Apr 28, 2020
Hitachi High-Technologies Corporation
Akinari Hanawa
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Transmission Electron Microscope
Publication number
20240186103
Publication date
Jun 6, 2024
Hitachi High-Tech Corporation
Akinari HANAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Device and Sample Observation Method
Publication number
20180076004
Publication date
Mar 15, 2018
Hitachi High-Technologies Corporation
Akinari HANAWA
H01 - BASIC ELECTRIC ELEMENTS