Akinori KOGURE

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Hadano-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Data processing device for scanning probe microscope
- Patent number 10,871,505
- Issue date Dec 22, 2020
- SHIMADZIJ CORPORATION
- Kenji Yamasaki
- G01 - MEASURING TESTING
Information Patent Grant
Sample container mounting member and sample container sealing method
- Patent number 10,830,791
- Issue date Nov 10, 2020
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder, fixing member and method for fixing sample
- Patent number 10,354,833
- Issue date Jul 16, 2019
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Surface analyzer
- Patent number 8,571,284
- Issue date Oct 29, 2013
- Shimadzu Corporation
- Takashi Morimoto
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
PROBE ASSESSMENT METHOD AND SPM
- Publication number 20240069064
- Publication date Feb 29, 2024
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND METHOD FOR MEASURING PHYSICAL QUANTIT...
- Publication number 20210316986
- Publication date Oct 14, 2021
- Shimadzu Corporation
- Kenji YAMASAKI
- B82 - NANO-TECHNOLOGY
Information Patent Application
DATA PROCESSING DEVICE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190383855
- Publication date Dec 19, 2019
- SHIMADZU CORPORATION
- Kenji YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CONTAINER MOUNTING MEMBER AND SAMPLE CONTAINER SEALING METHOD
- Publication number 20190353680
- Publication date Nov 21, 2019
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER, FIXING MEMBER AND METHOD FOR FIXING SAMPLE
- Publication number 20180330914
- Publication date Nov 15, 2018
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
Surface Analyzer
- Publication number 20120070039
- Publication date Mar 22, 2012
- Shimadzu Corporation
- Takashi MORIMOTO
- G01 - MEASURING TESTING