Akinori Okubo

Person

Hwaseong-si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Polarization measuring device and method of fabricating semiconduct...
- Patent number 11,946,809
- Issue date Apr 2, 2024
- Samsung Electronics Co., Ltd.
- Ingi Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting a defect on a substrate, apparatus for performi...
- Patent number 10,816,480
- Issue date Oct 27, 2020
- Samsung Electronics Co., Ltd.
- Eun-Hee Jeang
- G01 - MEASURING TESTING
Information Patent Grant
Optical test system and method, and method of manufacturing semicon...
- Patent number 10,401,301
- Issue date Sep 3, 2019
- Samsung Electronics Co., Ltd.
- Seongkeun Cho
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test device and imaging device including the same
- Patent number 9,880,270
- Issue date Jan 30, 2018
- Samsung Electronics Co., Ltd.
- Jae-hong Kim
- G10 - MUSICAL INSTRUMENTS ACOUSTICS

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD MONITORING SEMICONDUCTOR MANUFACTURING EQUIPMENT
- Publication number 20240128102
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- SUNGHO JANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME
- Publication number 20240118072
- Publication date Apr 11, 2024
- Samsung Electronics Co., Ltd.
- Sungho Jang
- G01 - MEASURING TESTING
Information Patent Application
STEALTH DICING LASER DEVICE
- Publication number 20230187235
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Akinori OKUBO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS FOR SUBSTRATE DICING AND METHOD THEROF
- Publication number 20230102791
- Publication date Mar 30, 2023
- Samsung Electronics Co., Ltd.
- Sung Ho JANG
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...
- Publication number 20230068376
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Ingi KIM
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETECTING A DEFECT ON A SUBSTRATE, APPARATUS FOR PERFORMI...
- Publication number 20200088649
- Publication date Mar 19, 2020
- Samsung Electronics Co., Ltd.
- Eun-Hee JEANG
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL TEST SYSTEM AND METHOD, AND METHOD OF MANUFACTURING SEMICON...
- Publication number 20190113463
- Publication date Apr 18, 2019
- Samsung Electronics Co., Ltd.
- Seongkeun CHO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test Device and Imaging Device Including the Same
- Publication number 20160116578
- Publication date Apr 28, 2016
- Samsung Electronics Co., Ltd.
- Jae-hong Kim
- G01 - MEASURING TESTING

Akinori Okubo

Person

Patents Grantslast 30 patents

Polarization measuring device and method of fabricating semiconduct...

Method of detecting a defect on a substrate, apparatus for performi...

Optical test system and method, and method of manufacturing semicon...

Test device and imaging device including the same

Patents Applicationslast 30 patents

APPARATUS AND METHOD MONITORING SEMICONDUCTOR MANUFACTURING EQUIPMENT

LEVEL SENSOR AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME

STEALTH DICING LASER DEVICE

APPARATUS FOR SUBSTRATE DICING AND METHOD THEROF

POLARIZATION MEASURING DEVICE AND METHOD OF FABRICATING SEMICONDUCT...

METHOD OF DETECTING A DEFECT ON A SUBSTRATE, APPARATUS FOR PERFORMI...

OPTICAL TEST SYSTEM AND METHOD, AND METHOD OF MANUFACTURING SEMICON...

Test Device and Imaging Device Including the Same