Akinori Saito

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Tsukuba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Coordinate measurement probe body
- Patent number 10,852,119
- Issue date Dec 1, 2020
- Mitutoyo Corporation
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe
- Patent number 10,415,949
- Issue date Sep 17, 2019
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe
- Patent number 10,393,495
- Issue date Aug 27, 2019
- Mitutoyo Corporation
- Satoshi Koga
- G01 - MEASURING TESTING
Information Patent Grant
Profile measuring instrument
- Patent number 9,115,973
- Issue date Aug 25, 2015
- Mitutoyo Corporation
- Yoshimasa Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Method of actuating a system, apparatus for modifying a control sig...
- Patent number 8,606,376
- Issue date Dec 10, 2013
- Mitutoyo Corporation
- Hartmut Illers
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of detecting a movement of a measuring probe and measuring i...
- Patent number 8,345,260
- Issue date Jan 1, 2013
- Mitutoyo Corporation
- Hartmut Illers
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Surface configuration measuring method
- Patent number 6,484,571
- Issue date Nov 26, 2002
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
COORDINATE MEASUREMENT PROBE BODY
- Publication number 20190120606
- Publication date Apr 25, 2019
- MITUTOYO CORPORATION
- Scott Allen Harsila
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20170248400
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Satoshi KOGA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE
- Publication number 20170248402
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Satoshi KOGA
- G01 - MEASURING TESTING
Information Patent Application
PROFILE MEASURING INSTRUMENT
- Publication number 20130321821
- Publication date Dec 5, 2013
- Yoshimasa SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
Method of actuating a system, apparatus for modifying a control sig...
- Publication number 20110004326
- Publication date Jan 6, 2011
- Mitutoyo Corporation
- Hans-Ulrich Danzebrink
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting a movement of a measuring probe and measuring i...
- Publication number 20100067021
- Publication date Mar 18, 2010
- Mitutoyo Corporation
- Hans-Ullrich Danzebrink
- G01 - MEASURING TESTING