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Akio Oosaki
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Kanagawa, JP
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Patents Grants
last 30 patents
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Patent Grant
Load current output circuit for electronic device and IC tester usi...
Patent number
6,448,800
Issue date
Sep 10, 2002
Hitachi Electronics Engineering Co., Ltd.
Keiichi Yamamoto
G01 - MEASURING TESTING
Information
Patent Grant
Diode element circuit and switch circuit using the same
Patent number
6,424,201
Issue date
Jul 23, 2002
Hitachi Electronics Engineering Co., Ltd.
Keiichi Yamamoto
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Semiconductor device tester and method for testing semiconductor de...
Patent number
6,275,023
Issue date
Aug 14, 2001
Hitachi Electronics Engineering Co., Ltd.
Akio Oosaki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Diode element circuit and switch circuit using the same
Publication number
20010048337
Publication date
Dec 6, 2001
Keiichi Yamamoto
H01 - BASIC ELECTRIC ELEMENTS