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Akio SHIBUYA
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Kanagawa, JP
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last 30 patents
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Patent Grant
Semiconductor device and method for manufacturing the same
Patent number
8,445,295
Issue date
May 21, 2013
Renesas Electronics Corporation
Akio Shibuya
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
Publication number
20110024911
Publication date
Feb 3, 2011
Renesas Electronics Corporation
Akio SHIBUYA
G01 - MEASURING TESTING