Akio Sumita

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Yokohama-Shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for quantitative evaluation of braze bonding l...
- Patent number 9,841,279
- Issue date Dec 12, 2017
- Kabushiki Kaisha Toshiba
- Ryosuke Ohirabaru
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Thickness measurement apparatus and method thereof
- Patent number 9,625,273
- Issue date Apr 18, 2017
- Kabushiki Kaisha Toshiba
- Hidehiko Kuroda
- G01 - MEASURING TESTING
Information Patent Grant
Survey meter
- Patent number 8,044,356
- Issue date Oct 25, 2011
- Kabushiki Kaisha Toshiba
- Akio Sumita
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detecting apparatus
- Patent number 6,570,160
- Issue date May 27, 2003
- Kabushiki Kaisha Toshiba
- Tatsuyuki Maekawa
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector
- Patent number 6,407,392
- Issue date Jun 18, 2002
- Kabushiki Kaisha Toshiba
- Akira Tsuyuki
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector
- Patent number 6,392,236
- Issue date May 21, 2002
- Kabushiki Kaisha Toshiba
- Tatsuyuki Maekawa
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector, radiation measurement system and radiation meas...
- Patent number 6,333,502
- Issue date Dec 25, 2001
- Kabushiki Kaisha Toshiba
- Akio Sumita
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR QUANTITATIVE EVALUATION OF BRAZE BONDING L...
- Publication number 20160265909
- Publication date Sep 15, 2016
- KABUSHIKI KAISHA TOSHIBA
- Ryosuke OHIRABARU
- G01 - MEASURING TESTING
Information Patent Application
THICKNESS MEASUREMENT APPARATUS AND METHOD THEREOF
- Publication number 20130197846
- Publication date Aug 1, 2013
- Kabushiki Kaisha Toshiba
- Hidehiko Kuroda
- G01 - MEASURING TESTING
Information Patent Application
SURVEY METER
- Publication number 20100282975
- Publication date Nov 11, 2010
- Kabushiki Kaisha Toshiba
- Akio Sumita
- G01 - MEASURING TESTING
Information Patent Application
Radiation detecting apparatus
- Publication number 20030030003
- Publication date Feb 13, 2003
- KABUSHHIKI KAISHA TOSHIBA
- Tatsuyuki Maekawa
- G01 - MEASURING TESTING