Membership
Tour
Register
Log in
Akio Yasukawa
Follow
Person
Chiyoda, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Thermal humidity sensor
Patent number
8,104,355
Issue date
Jan 31, 2012
Hitachi Automotive Systems, Ltd.
Rintaro Minamitani
G01 - MEASURING TESTING
Information
Patent Grant
Air flow meter
Patent number
7,992,435
Issue date
Aug 9, 2011
Hitachi Automotive Systems, Ltd.
Rintaro Minamitani
G01 - MEASURING TESTING
Information
Patent Grant
Air flow measuring instrument having dust particle diverting structure
Patent number
7,942,053
Issue date
May 17, 2011
Hitachi, Ltd.
Naoki Saito
G01 - MEASURING TESTING
Information
Patent Grant
Heating resistor type flow measuring device housing structure havin...
Patent number
7,469,582
Issue date
Dec 30, 2008
Hitachi, Ltd.
Naoki Saito
G01 - MEASURING TESTING
Information
Patent Grant
Thermal type gas flow meter
Patent number
7,437,927
Issue date
Oct 21, 2008
Hitachi, Ltd.
Masamichi Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Air flow rate measuring device
Patent number
7,437,926
Issue date
Oct 21, 2008
Hitachi, Ltd.
Masayuki Kozawa
G01 - MEASURING TESTING
Information
Patent Grant
Heating resistor type flow measuring device
Patent number
7,062,964
Issue date
Jun 20, 2006
Hitachi, Ltd.
Naoki Saito
G01 - MEASURING TESTING
Information
Patent Grant
Capacitive type pressure sensor
Patent number
6,877,383
Issue date
Apr 12, 2005
Hitachi, Ltd.
Junichi Horie
G01 - MEASURING TESTING
Information
Patent Grant
Heated type air flow rate sensor and its forming method
Patent number
6,698,282
Issue date
Mar 2, 2004
Hitachi, Ltd.
Akio Yasukawa
G01 - MEASURING TESTING
Information
Patent Grant
Power inverter
Patent number
6,414,867
Issue date
Jul 2, 2002
Hitachi, Ltd.
Osamu Suzuki
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Semiconductor device
Patent number
6,410,978
Issue date
Jun 25, 2002
Hitachi, Ltd.
Akio Yasukawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wire bonding method and apparatus and semiconductor device
Patent number
6,271,601
Issue date
Aug 7, 2001
Hitachi, Ltd.
Noriaki Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Resin sealed semiconductor device having improved arrangement for r...
Patent number
6,265,784
Issue date
Jul 24, 2001
Hitachi, Ltd.
Kenya Kawano
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Capacitance type pressure sensor with capacitive elements actuated...
Patent number
6,167,761
Issue date
Jan 2, 2001
Hitachi, Ltd. and Hitachi Car Engineering Co., Ltd.
Keiji Hanzawa
G01 - MEASURING TESTING
Information
Patent Grant
Inverter device with cooling arrangement therefor
Patent number
6,166,937
Issue date
Dec 26, 2000
Hitachi Ltd.
Hirohisa Yamamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cylinder pressure sensor
Patent number
5,936,235
Issue date
Aug 10, 1999
Hitachi, Ltd.
Rintaro Minamitani
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device
Patent number
5,793,106
Issue date
Aug 11, 1998
Hitachi, Ltd.
Akio Yasukawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic device for offsetting adverse effects of a plurality of...
Patent number
5,606,487
Issue date
Feb 25, 1997
Hitachi, Ltd.
Akio Yasukawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electric component part having lead terminals
Patent number
4,739,125
Issue date
Apr 19, 1988
Hitachi, Ltd.
Yutaka Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ceramic multilayer wiring board
Patent number
4,604,496
Issue date
Aug 5, 1986
Hitachi, Ltd.
Shosaku Ishihara
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of producing semiconductor displacement transducer
Patent number
4,319,397
Issue date
Mar 16, 1982
Hitachi, Ltd.
Masanori Tanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor strain gauge with elastic load plate
Patent number
4,292,618
Issue date
Sep 29, 1981
Hitachi, Ltd.
Masanori Tanabe
G01 - MEASURING TESTING
Information
Patent Grant
Magnetron strap ring structure
Patent number
4,205,257
Issue date
May 27, 1980
Hitachi, Ltd.
Tomokatsu Oguro
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Heating Resistance Type Air Flow Rate Measuring Device
Publication number
20110072897
Publication date
Mar 31, 2011
Hitachi Automotive Systems, Ltd.
Rintaro MINAMITANI
G01 - MEASURING TESTING
Information
Patent Application
Measurement Element
Publication number
20100218614
Publication date
Sep 2, 2010
Hitachi Automotive Systems, Ltd.
Rintaro Minamitani
G01 - MEASURING TESTING
Information
Patent Application
Air Flow Meter
Publication number
20100077851
Publication date
Apr 1, 2010
Hitachi Automotive Systems, Ltd.
Rintaro Minamitani
G01 - MEASURING TESTING
Information
Patent Application
Air Flow Measuring Instrument
Publication number
20090126477
Publication date
May 21, 2009
Hitachi, Ltd
Naoki Saito
G01 - MEASURING TESTING
Information
Patent Application
Thermal Type Gas Flow Meter
Publication number
20080053215
Publication date
Mar 6, 2008
Hitachi, Ltd
Masamichi YAMADA
G01 - MEASURING TESTING
Information
Patent Application
Air Flow Rate Measuring Device
Publication number
20070295080
Publication date
Dec 27, 2007
HITACHI, LTD.
Masayuki Kozawa
G01 - MEASURING TESTING
Information
Patent Application
Gas flow measuring apparatus
Publication number
20070089504
Publication date
Apr 26, 2007
Keiji Hanzawa
G01 - MEASURING TESTING
Information
Patent Application
Heating resistor type flow measuring device
Publication number
20040129073
Publication date
Jul 8, 2004
Naoki Saito
G01 - MEASURING TESTING
Information
Patent Application
Capacitive type pressure sensor
Publication number
20030019299
Publication date
Jan 30, 2003
Hitachi, Ltd.
Junichi Horie
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20020050403
Publication date
May 2, 2002
AKIO YASUKAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Heated type air flow rate sensor and its forming method
Publication number
20020023487
Publication date
Feb 28, 2002
Akio Yasukawa
G01 - MEASURING TESTING
Information
Patent Application
Wire bonding method and apparatus, and semiconductor device
Publication number
20010042925
Publication date
Nov 22, 2001
Noriaki Yamamoto
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Power inverter
Publication number
20010014029
Publication date
Aug 16, 2001
Osamu Suzuki
H01 - BASIC ELECTRIC ELEMENTS