Akira Arake

Follow

Person

Takatsuki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analyzing apparatus
- Patent number 6,708,121
- Issue date Mar 16, 2004
- Rigaku Industrial Corporation
- Akira Arake
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analyzer useable as wavelength dispersive type an...
- Patent number 6,292,532
- Issue date Sep 18, 2001
- Rigaku Industrial Corporation
- Naoki Kawahara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Analyzing apparatus
- Publication number 20020052695
- Publication date May 2, 2002
- Akira Arake
- G01 - MEASURING TESTING