Akira Echizenya

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray diffraction measuring apparatus having debye-scherrer optical...
- Patent number 7,860,217
- Issue date Dec 28, 2010
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray optical system
- Patent number 7,542,548
- Issue date Jun 2, 2009
- Rigaku Corp.
- Ryuji Matsuo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical...
- Publication number 20090086910
- Publication date Apr 2, 2009
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
X-ray optical system
- Publication number 20080084967
- Publication date Apr 10, 2008
- Rigaku Corporation
- Ryuji Matsuo
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING