Akira Egawa

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic amount sensor
- Patent number 7,886,597
- Issue date Feb 15, 2011
- Seiko Instruments Inc.
- Takeshi Uchiyama
- G01 - MEASURING TESTING
Information Patent Grant
Angular velocity sensor having one amplifying circuit for amplifyin...
- Patent number 7,444,870
- Issue date Nov 4, 2008
- Seiko Instruments Inc.
- Takeshi Uchiyama
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,740,876
- Issue date May 25, 2004
- Seiko Instruments Inc.
- Tatsuya Miyatani
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 6,710,339
- Issue date Mar 23, 2004
- Seiko Instruments Inc.
- Akira Egawa
- G01 - MEASURING TESTING
Information Patent Grant
Sample observation plate and observation apparatus
- Patent number 6,645,434
- Issue date Nov 11, 2003
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Optical probe and method for manufacturing same and scanning proxim...
- Patent number 6,430,324
- Issue date Aug 6, 2002
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method for sharpening a probe
- Patent number 6,280,647
- Issue date Aug 28, 2001
- Seiko Instruments Inc.
- Hiroshi Muramatsu
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Dynamic amount sensor
- Publication number 20070240509
- Publication date Oct 18, 2007
- Takeshi Uchiyama
- G01 - MEASURING TESTING
Information Patent Application
Angular velocity sensor
- Publication number 20070180909
- Publication date Aug 9, 2007
- Takeshi Uchiyama
- G01 - MEASURING TESTING
Information Patent Application
Mechanical quantity sensor
- Publication number 20070051182
- Publication date Mar 8, 2007
- Akira Egawa
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope
- Publication number 20020079446
- Publication date Jun 27, 2002
- Tatsuya Miyatani
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe microscope
- Publication number 20010030286
- Publication date Oct 18, 2001
- Akira Egawa
- B82 - NANO-TECHNOLOGY