Membership
Tour
Register
Log in
Akira Emoto
Follow
Person
Tsukuba-shi, Ibaraki, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Birefringence measurement device and birefringence measurement method
Patent number
10,119,904
Issue date
Nov 6, 2018
National Institute of Advanced Industrial Science
Akira Emoto
G01 - MEASURING TESTING
Information
Patent Grant
Localized surface plasmon resonance sensing chip and localized surf...
Patent number
10,001,439
Issue date
Jun 19, 2018
National Institute of Advanced Industrial Science and Technology
Takashi Fukuda
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
REFLECTIVE POLARIZED LIGHT SEPARATION AND DIFFRACTION ELEMENT AND O...
Publication number
20230048604
Publication date
Feb 16, 2023
JASCO CORPORATION
Takashi FUKUDA
G01 - MEASURING TESTING
Information
Patent Application
Birefringence Measurement Device and Birefringence Measurement Method
Publication number
20170276597
Publication date
Sep 28, 2017
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Akira EMOTO
G01 - MEASURING TESTING
Information
Patent Application
LOCALIZED SURFACE PLASMON RESONANCE SENSING CHIP AND LOCALIZED SURF...
Publication number
20170219488
Publication date
Aug 3, 2017
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Takashi Fukuda
G02 - OPTICS