Akira EZAKI

Person

Hyogo-ken, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 12,283,614
- Issue date Apr 22, 2025
- Kabushiki Kaisha Toshiba
- Shinji Onduka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device
- Patent number 10,141,399
- Issue date Nov 27, 2018
- Kabushiki Kaisha Toshiba
- Hideki Okumura
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20250194209
- Publication date Jun 12, 2025
- Kabushiki Kaisha Toshiba
- Shinji Onduka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20240145558
- Publication date May 2, 2024
- Kabushiki Kaisha Toshiba
- Shinji Onduka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20210296455
- Publication date Sep 23, 2021
- Kabushiki Kaisha Toshiba
- Shinji Onduka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160276430
- Publication date Sep 22, 2016
- Kabushiki Kaisha Toshiba
- Hideki Okumura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, METHOD OF FABRICATING SE...
- Publication number 20150056727
- Publication date Feb 26, 2015
- Kabushiki Kaisha Toshiba
- Daisuke YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
SUPPORTING SUBSTRATE, METHOD FOR FABRICATING SEMICONDUCTOR DEVICE,...
- Publication number 20130252356
- Publication date Sep 26, 2013
- Kabushiki Kaisha Toshiba
- Akira EZAKI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF FABRICATING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PRODUC...
- Publication number 20130240131
- Publication date Sep 19, 2013
- Kabushiki Kaisha Toshiba
- Akira EZAKI
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE, METHOD OF FABRICATING SE...
- Publication number 20130244351
- Publication date Sep 19, 2013
- Kabushiki Kaisha Toshiba
- Daisuke YAMASHITA
- G01 - MEASURING TESTING

Akira EZAKI

Person

Patents Grantslast 30 patents

Semiconductor device

Semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

METHOD OF INSPECTING SEMICONDUCTOR DEVICE, METHOD OF FABRICATING SE...

SUPPORTING SUBSTRATE, METHOD FOR FABRICATING SEMICONDUCTOR DEVICE,...

METHOD OF FABRICATING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PRODUC...

METHOD OF INSPECTING SEMICONDUCTOR DEVICE, METHOD OF FABRICATING SE...