Akira Hamaguchi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscopy system and pattern depth measurement m...
- Patent number 11,545,336
- Issue date Jan 3, 2023
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope apparatus, inspection system using electron mic...
- Patent number 11,302,513
- Issue date Apr 12, 2022
- HITACHI HIGH-TECH CORPORATION
- Takahiro Nishihata
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANAGING SECRET INFORMATION
- Publication number 20240232383
- Publication date Jul 11, 2024
- RENESAS ELECTRONICS CORPORATION
- Akira HAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANAGING SECRET INFORMATION
- Publication number 20240135005
- Publication date Apr 25, 2024
- RENESAS ELECTRONICS CORPORATION
- Akira HAMAGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
KEY UPDATE MANAGEMENT SYSTEM AND KEY UPDATE MANAGEMENT METHOD
- Publication number 20240089097
- Publication date Mar 14, 2024
- RENESAS ELECTRONICS CORPORATION
- Takahiko SUGAHARA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SCANNING ELECTRON MICROSCOPY SYSTEM AND PATTERN DEPTH MEASUREMENT M...
- Publication number 20210027983
- Publication date Jan 28, 2021
- Hitachi High-Tech Corporation
- Takahiro Nishihata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE APPARATUS, INSPECTION SYSTEM USING ELECTRON MIC...
- Publication number 20210012998
- Publication date Jan 14, 2021
- Hitachi High-Tech Corporation
- Takahiro Nishihata
- G06 - COMPUTING CALCULATING COUNTING