Akira Inagaki

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 9,291,634
- Issue date Mar 22, 2016
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 8,658,102
- Issue date Feb 25, 2014
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 7,722,815
- Issue date May 25, 2010
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Chemical analysis apparatus and chemical analysis method
- Patent number 7,670,558
- Issue date Mar 2, 2010
- Hitachi High-Technologies Corporation
- Hajime Katou
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis apparatus with liquid level detection function
- Patent number 6,413,475
- Issue date Jul 2, 2002
- Hitachi, Ltd.
- Masato Ishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for trasferring liquid having liquid level sensing function
- Patent number 5,855,851
- Issue date Jan 5, 1999
- Hitachi, Ltd.
- Shigeki Matsubara
- G01 - MEASURING TESTING
Information Patent Grant
Projection type exposure method and apparatus
- Patent number 5,247,329
- Issue date Sep 21, 1993
- Hitachi, Ltd.
- Yoshitada Oshida
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical information processing apparatus and optical pickup therefor
- Patent number 5,195,070
- Issue date Mar 16, 1993
- Hitachi, Ltd.
- Masataka Shiba
- G11 - INFORMATION STORAGE
Information Patent Grant
Optical information storing apparatus and method for production of...
- Patent number 5,191,624
- Issue date Mar 2, 1993
- Hitachi, Ltd.
- Kenchi Ito
- G02 - OPTICS
Information Patent Grant
Surface acoustic waveguide device and manufacturing method
- Patent number 5,187,756
- Issue date Feb 16, 1993
- Hitachi, Ltd.
- Masataka Shiba
- G02 - OPTICS
Information Patent Grant
Method and apparatus for detecting focal plane
- Patent number 5,153,916
- Issue date Oct 6, 1992
- Hitachi, Ltd.
- Akira Inagaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Beam control method and apparatus
- Patent number 5,134,298
- Issue date Jul 28, 1992
- Hitachi, Ltd.
- Akira Inagaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information detecting system of scanning type
- Patent number 5,121,449
- Issue date Jun 9, 1992
- Hitachi, Ltd.
- Masataka Shiba
- G02 - OPTICS
Information Patent Grant
X-ray exposure apparatus
- Patent number 4,825,453
- Issue date Apr 25, 1989
- Hitachi, Ltd.
- Yukio Kembo
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for alignment
- Patent number 4,777,641
- Issue date Oct 11, 1988
- Hitachi, Ltd.
- Akira Inagaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Projection alignment method and apparatus
- Patent number 4,708,484
- Issue date Nov 24, 1987
- Hitachi, Ltd.
- Yoshihiro Komeyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Light-exposure apparatus
- Patent number 4,666,291
- Issue date May 19, 1987
- Hitachi, Ltd.
- Motoya Taniguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
- Publication number 20140147348
- Publication date May 29, 2014
- Hitachi High-Technologies Corporation
- Hajime KATOU
- G01 - MEASURING TESTING
Information Patent Application
CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD
- Publication number 20100233027
- Publication date Sep 16, 2010
- Hajime Katou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Chemical analysis apparatus and chemical analysis method
- Publication number 20070009387
- Publication date Jan 11, 2007
- Hajime Katou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Chemical analysis apparatus and chemical analysis method
- Publication number 20030166260
- Publication date Sep 4, 2003
- Hajime Katou
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
AUTOMATIC ANALYSIS APPARATUS WITH LIQUID LEVEL DETECTION FUNCTION
- Publication number 20020009393
- Publication date Jan 24, 2002
- MASATO ISHIZAWA
- G01 - MEASURING TESTING

Akira Inagaki

Person

Patents Grantslast 30 patents

Chemical analysis apparatus and chemical analysis method

Chemical analysis apparatus and chemical analysis method

Chemical analysis apparatus and chemical analysis method

Chemical analysis apparatus and chemical analysis method

Automatic analysis apparatus with liquid level detection function

Apparatus for trasferring liquid having liquid level sensing function

Projection type exposure method and apparatus

Optical information processing apparatus and optical pickup therefor

Optical information storing apparatus and method for production of...

Surface acoustic waveguide device and manufacturing method

Method and apparatus for detecting focal plane

Beam control method and apparatus

Information detecting system of scanning type

X-ray exposure apparatus

Method and apparatus for alignment

Projection alignment method and apparatus

Light-exposure apparatus

Patents Applicationslast 30 patents

CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD

CHEMICAL ANALYSIS APPARATUS AND CHEMICAL ANALYSIS METHOD

Chemical analysis apparatus and chemical analysis method

Chemical analysis apparatus and chemical analysis method

AUTOMATIC ANALYSIS APPARATUS WITH LIQUID LEVEL DETECTION FUNCTION