Akira Ishida

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Tsukuba-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Bimetallic probe with tip end
- Patent number 7,692,438
- Issue date Apr 6, 2010
- National Institute for Materials Science
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Grant
Light wave interference length-measuring apparatus
- Patent number 4,948,254
- Issue date Aug 14, 1990
- Research Development Corporation of Japan
- Akira Ishida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe
- Publication number 20080054916
- Publication date Mar 6, 2008
- Kazumichi Machida
- G01 - MEASURING TESTING