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Akira JOJI

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,073,526
    • Issue date Jul 27, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akira Joji
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,067,587
    • Issue date Jul 20, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Akira Joji
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230280362
    • Publication date Sep 7, 2023
    • Hitachi High-Tech Corporation
    • Akira JOJI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20220178960
    • Publication date Jun 9, 2022
    • Hitachi High-Tech Corporation
    • Akira JOJI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200110104
    • Publication date Apr 9, 2020
    • Hitachi High-Technologies Corporation
    • Akira JOJI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20190033332
    • Publication date Jan 31, 2019
    • Hitachi High-Technologies Corporation
    • Akira JOJI
    • G01 - MEASURING TESTING