Akira JOJI

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Automatic analyzer with a controller capable of determining the pre...
- Patent number 12,352,772
- Issue date Jul 8, 2025
- HITACHI HIGH-TECH CORPORATION
- Akira Joji
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,073,526
- Issue date Jul 27, 2021
- HITACHI HIGH-TECH CORPORATION
- Akira Joji
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analysis device
- Patent number 11,067,587
- Issue date Jul 20, 2021
- HITACHI HIGH-TECH CORPORATION
- Akira Joji
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYZER AND OPERATION METHOD FOR AUTOMATIC ANALYZER
- Publication number 20240369585
- Publication date Nov 7, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuki MIYADA
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer
- Publication number 20230280362
- Publication date Sep 7, 2023
- Hitachi High-Tech Corporation
- Akira JOJI
- G01 - MEASURING TESTING
Information Patent Application
Automatic Analyzer
- Publication number 20220178960
- Publication date Jun 9, 2022
- Hitachi High-Tech Corporation
- Akira JOJI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20200110104
- Publication date Apr 9, 2020
- Hitachi High-Technologies Corporation
- Akira JOJI
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYSIS DEVICE
- Publication number 20190033332
- Publication date Jan 31, 2019
- Hitachi High-Technologies Corporation
- Akira JOJI
- G01 - MEASURING TESTING