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Akira Karakama
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Hitachinaka, JP
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last 30 patents
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Patent Grant
Charged particle beam apparatus, and image generation method with c...
Patent number
8,168,950
Issue date
May 1, 2012
Hitachi High-Technologies Corporation
Kanji Furuhashi
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Semiconductor inspection apparatus
Patent number
7,916,926
Issue date
Mar 29, 2011
Hitachi High-Technologies Corporation
Hidemitsu Naya
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Patents Applications
last 30 patents
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Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND IMAGE GENERATION METHOD WITH C...
Publication number
20090134340
Publication date
May 28, 2009
Hitachi High-Technologies Corporation
Kanji FURUHASHI
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
Semiconductor inspection apparatus
Publication number
20070024643
Publication date
Feb 1, 2007
Hitachi High-Technologies Corporation
Hidemitsu Naya
G06 - COMPUTING CALCULATING COUNTING