Akira Kazama

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface inspection method and surface inspection apparatus for stee...
- Patent number 9,389,169
- Issue date Jul 12, 2016
- JFE Steel Corporation
- Akira Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Method for marking defect and device therefor
- Patent number 7,599,052
- Issue date Oct 6, 2009
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Method for marking defect and device therefor
- Patent number 7,423,744
- Issue date Sep 9, 2008
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Method for marking defect and device therefor
- Patent number 7,248,366
- Issue date Jul 24, 2007
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Grant
Method and apparatus for detecting surface flaws
- Patent number 5,835,220
- Issue date Nov 10, 1998
- NKK Corporation
- Akira Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer and method of controlling coating thickness therewith
- Patent number 5,438,415
- Issue date Aug 1, 1995
- NKK Corporation
- Akira Kazama
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method for ellipsometric parameter and ellipsometer
- Patent number 5,335,066
- Issue date Aug 2, 1994
- NKK Corporation
- Takeo Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Measuring method for ellipsometric parameter and ellipsometer
- Patent number 5,311,285
- Issue date May 10, 1994
- NKK Corporation
- Takahiko Oshige
- G01 - MEASURING TESTING
Information Patent Grant
Manufacturing method and equipment of single silicon crystal
- Patent number 5,126,114
- Issue date Jun 30, 1992
- NKK Corporation
- Hiroshi Kamio
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method and apparatus for manufacturing silicon single crystals
- Patent number 5,087,429
- Issue date Feb 11, 1992
- NKK Corporation
- Hiroshi Kamio
- C30 - CRYSTAL GROWTH
Information Patent Grant
Manufacturing method and equipment of single silicon crystal
- Patent number 5,087,321
- Issue date Feb 11, 1992
- NKK Corporation
- Hiroshi Kamio
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
SURFACE INSPECTION METHOD AND SURFACE INSPECTION APPARATUS FOR STEE...
- Publication number 20130050470
- Publication date Feb 28, 2013
- JFE Steel Corporation
- Akira Kazama
- G01 - MEASURING TESTING
Information Patent Application
Method for marking defect and device therefor
- Publication number 20090086209
- Publication date Apr 2, 2009
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
Method for marking defect and device therefor
- Publication number 20070052964
- Publication date Mar 8, 2007
- NKK Corporation
- Mitsuaki Uesugi
- B21 - MECHANICAL METAL-WORKING WITHOUT ESSENTIALLY REMOVING MATERIAL PUNCHING...
Information Patent Application
Method for marking defect and device therefor
- Publication number 20020154308
- Publication date Oct 24, 2002
- NKK Corporation, a Japanese Corporation
- Mitsuaki Uesugi
- G01 - MEASURING TESTING

Akira Kazama

Person

Patents Grantslast 30 patents

Surface inspection method and surface inspection apparatus for stee...

Method for marking defect and device therefor

Method for marking defect and device therefor

Method for marking defect and device therefor

Method and apparatus for detecting surface flaws

Ellipsometer and method of controlling coating thickness therewith

Measuring method for ellipsometric parameter and ellipsometer

Measuring method for ellipsometric parameter and ellipsometer

Manufacturing method and equipment of single silicon crystal

Method and apparatus for manufacturing silicon single crystals

Manufacturing method and equipment of single silicon crystal

Patents Applicationslast 30 patents

SURFACE INSPECTION METHOD AND SURFACE INSPECTION APPARATUS FOR STEE...

Method for marking defect and device therefor

Method for marking defect and device therefor

Method for marking defect and device therefor