Akira KURAMOTO

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample analyzer and sample analysis method
- Patent number 11,043,369
- Issue date Jun 22, 2021
- TOSHIBA MEMORY CORPORATION
- Akira Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Atom probe inspection device, field ion microscope, and distortion...
- Patent number 10,916,405
- Issue date Feb 9, 2021
- TOSHIBA MEMORY CORPORATION
- Takahiro Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method for manufacturing same
- Patent number 10,026,743
- Issue date Jul 17, 2018
- TOSHIBA MEMORY CORPORATION
- Nobuhito Kuge
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analytical apparatus, sample holder and analytical method
- Patent number 9,734,985
- Issue date Aug 15, 2017
- Kabushiki Kaisha Toshiba
- Haruko Akutsu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ATOM PROBE INSPECTION DEVICE, FIELD ION MICROSCOPE, AND DISTORTION...
- Publication number 20200286711
- Publication date Sep 10, 2020
- Toshiba Memory Corporation
- Takahiro IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYZER AND SAMPLE ANALYSIS METHOD
- Publication number 20190279855
- Publication date Sep 12, 2019
- Toshiba Memory Corporation
- Akira KURAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20180047741
- Publication date Feb 15, 2018
- Toshiba Memory Corporation
- Nobuhito KUGE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ANALYTICAL APPARATUS, SAMPLE HOLDER AND ANALYTICAL METHOD
- Publication number 20170004954
- Publication date Jan 5, 2017
- KABUSHIKI KAISHA TOSHIBA
- Haruko AKUTSU
- H01 - BASIC ELECTRIC ELEMENTS