Akira Motohara

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
ID installable LSI, secret key installation method, LSI test method...
- Patent number 7,284,134
- Issue date Oct 16, 2007
- Matsushita Electric Industrial Co., Ltd.
- Makoto Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
LSI design method and verification method
- Patent number 7,281,136
- Issue date Oct 9, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kentaro Shiomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, function setting method thereof, and evaluati...
- Patent number 7,148,503
- Issue date Dec 12, 2006
- Matsushita Electric Industrial Co., Ltd.
- Katsuya Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of designing semiconductor integrated circuit utilizing a sc...
- Patent number 7,017,135
- Issue date Mar 21, 2006
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Method for designing integrated circuit device
- Patent number 6,886,150
- Issue date Apr 26, 2005
- Matsushita Electric Industrial Co., Ltd.
- Makoto Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of designing integrated circuit device using common paramete...
- Patent number 6,671,857
- Issue date Dec 30, 2003
- Matsushita Electric Industrial Co., Ltd.
- Miwaka Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for designing integrated circuit based on the transaction an...
- Patent number 6,668,337
- Issue date Dec 23, 2003
- Matsushita Electric Industrial Co., Ltd.
- Miwaka Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for designing integrated circuit device and database for des...
- Patent number 6,523,157
- Issue date Feb 18, 2003
- Matsushita Electric Industrial Co., Ltd.
- Miwaka Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for improving the efficiency of designing a system-on-chip i...
- Patent number 6,415,416
- Issue date Jul 2, 2002
- Matsushita Electric Industrial Co., Ltd.
- Makoto Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of designing semiconductor integrated circuit
- Patent number 6,282,506
- Issue date Aug 28, 2001
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit with a testable block
- Patent number 5,894,482
- Issue date Apr 13, 1999
- Matsushita Electric Industrial Co., Ltd.
- Akira Motohara
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit with a testable block
- Patent number 5,729,553
- Issue date Mar 17, 1998
- Matsushita Electric Industrial Co., Ltd.
- Akira Motohara
- G01 - MEASURING TESTING
Information Patent Grant
Method for generating test sequences for detecting faults in target...
- Patent number 5,617,427
- Issue date Apr 1, 1997
- Matsushita Electcric Industrial Co., Ltd.
- Mitsuyasu Ohta
- G01 - MEASURING TESTING
Information Patent Grant
Test sequence generation method
- Patent number 5,483,543
- Issue date Jan 9, 1996
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for generating test pattern for sequential log...
- Patent number 5,430,736
- Issue date Jul 4, 1995
- Matsushita Electric Industrial, Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing automatic test pattern generation
- Patent number 5,319,647
- Issue date Jun 7, 1994
- Matsushita Electric Industrial Co., Ltd.
- Toshinori Hosokawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of test sequence generation
- Patent number 5,305,328
- Issue date Apr 19, 1994
- Matsushita Electric Industrial Co., Ltd.
- Akira Motohara
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF DESIGNING SEMICONDUCTOR INTEGRATED CIRCUIT IN WHICH FAULT...
- Publication number 20090106721
- Publication date Apr 23, 2009
- PANASONIC CORPORATION
- Sadami TAKEOKA
- G01 - MEASURING TESTING
Information Patent Application
ID installable LSI, secret key installation method, LSI test method...
- Publication number 20080046759
- Publication date Feb 21, 2008
- Matsushita Electric Industrial Co., Ltd.
- Makoto Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LSI design method and verification method
- Publication number 20080028233
- Publication date Jan 31, 2008
- Matsushita Electric Industrial Co., Ltd.
- Kentaro Shiomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LSI design method and verification method
- Publication number 20070011468
- Publication date Jan 11, 2007
- Matsushita Electric Industrial Co., Ltd.
- Kentaro Shiomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device, function setting method thereof, and evaluati...
- Publication number 20060275932
- Publication date Dec 7, 2006
- Matsushita Electric Industrial Co., Ltd.
- Katsuya Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of designing integrated circuit device and database
- Publication number 20040054976
- Publication date Mar 18, 2004
- Matsushita Electric Industrial Co., Ltd.
- Miwaka Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ID installable LSI, secret key installation method, LSI test method...
- Publication number 20030088785
- Publication date May 8, 2003
- Makoto Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LSI design method and verification method
- Publication number 20020083330
- Publication date Jun 27, 2002
- Kentaro Shiomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for designing integrated circuit device
- Publication number 20020073381
- Publication date Jun 13, 2002
- MASUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Makoto Fujiwara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device, function setting method thereof, and evaluati...
- Publication number 20020014699
- Publication date Feb 7, 2002
- MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
- Katsuya Fujimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for designing ingegrated circuit
- Publication number 20020004927
- Publication date Jan 10, 2002
- Miwaka Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of edsigning semiconductor integrated circuit
- Publication number 20010021990
- Publication date Sep 13, 2001
- Matsushita Electric Industrial Co., Ltd.
- Sadami Takeoka
- G01 - MEASURING TESTING

Akira Motohara

Person

Patents Grantslast 30 patents

ID installable LSI, secret key installation method, LSI test method...

LSI design method and verification method

Semiconductor device, function setting method thereof, and evaluati...

Method of designing semiconductor integrated circuit utilizing a sc...

Method for designing integrated circuit device

Method of designing integrated circuit device using common paramete...

Method for designing integrated circuit based on the transaction an...

Method for designing integrated circuit device and database for des...

Method for improving the efficiency of designing a system-on-chip i...

Method of designing semiconductor integrated circuit

Semiconductor integrated circuit with a testable block

Semiconductor integrated circuit with a testable block

Method for generating test sequences for detecting faults in target...

Test sequence generation method

Method and apparatus for generating test pattern for sequential log...

Method and apparatus for performing automatic test pattern generation

Method of test sequence generation

Patents Applicationslast 30 patents

METHOD OF DESIGNING SEMICONDUCTOR INTEGRATED CIRCUIT IN WHICH FAULT...

ID installable LSI, secret key installation method, LSI test method...

LSI design method and verification method

LSI design method and verification method

Semiconductor device, function setting method thereof, and evaluati...

Method of designing integrated circuit device and database

ID installable LSI, secret key installation method, LSI test method...

LSI design method and verification method

Method for designing integrated circuit device

Semiconductor device, function setting method thereof, and evaluati...

Method for designing ingegrated circuit

Method of edsigning semiconductor integrated circuit