Akira Nambu

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and its sample holder
- Patent number 10,073,116
- Issue date Sep 11, 2018
- Hitachi, Ltd.
- Sanato Nagata
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measuring method using same
- Patent number 9,423,416
- Issue date Aug 23, 2016
- Hitachi, Ltd.
- Akira Nambu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE HOLDER THEREFOR
- Publication number 20170343580
- Publication date Nov 30, 2017
- Hitachi, Ltd
- Sanato NAGATA
- G01 - MEASURING TESTING
Information Patent Application
HOLDER FOR PROBE MICROSCOPE, PROBE MICROSCOPE AND SPECIMEN MEASUREM...
- Publication number 20150192604
- Publication date Jul 9, 2015
- Hitachi, Ltd
- Tsuyoshi Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND MEASURING METHOD USING SAME
- Publication number 20150177275
- Publication date Jun 25, 2015
- Hitachi, Ltd.
- Akira Nambu
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS
- Publication number 20130279652
- Publication date Oct 24, 2013
- Hitachi, Ltd
- Akira NAMBU
- G01 - MEASURING TESTING