Akira Nishina

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method and an apparatus for analyzing trace impurities in gases
- Patent number 6,653,144
- Issue date Nov 25, 2003
- Nippon Sanso Corporation
- Akira Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Gas analyzing apparatus
- Patent number 6,550,308
- Issue date Apr 22, 2003
- Nippon Sanso Corporation
- Tsutomu Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and process for supplying gas
- Patent number 6,523,567
- Issue date Feb 25, 2003
- Nippon Sanso Corporation
- Tetsuya Satou
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Gas supplying apparatus and gas substitution method
- Patent number 6,478,040
- Issue date Nov 12, 2002
- Nippon Sanso Corporation
- Tsutomu Kikuchi
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Grant
Method and apparatus for analyzing impurities in gases
- Patent number 6,474,136
- Issue date Nov 5, 2002
- Nippon Sanso Corporation
- Akira Nishina
- G01 - MEASURING TESTING
Information Patent Grant
System for analyzing trace amounts of impurities in gases
- Patent number 6,418,781
- Issue date Jul 16, 2002
- Nippon Sanso Corporation
- Akira Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Gas analyzing apparatus
- Patent number 6,397,660
- Issue date Jun 4, 2002
- Nippon Sanso Corporation
- Tsutomu Kikuchi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-gas analysis system for analyzing high-purity gases
- Patent number 6,324,892
- Issue date Dec 4, 2001
- Nippon Sanso Corporation
- Akira Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Method for analyzing impurities in gas and its analyzer
- Patent number 6,000,275
- Issue date Dec 14, 1999
- Nippon Sanso Corporation
- Akira Nishina
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method and an apparatus for analyzing trace impurities in gases
- Publication number 20030092193
- Publication date May 15, 2003
- NIPPON SANSO CORPORATION
- Akira Nishina
- G01 - MEASURING TESTING
Information Patent Application
Method and an apparatus for analyzing trace impurities in gases
- Publication number 20030086826
- Publication date May 8, 2003
- NIPPON SANSO CORPORATION
- Akira Nishina
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and process for supplying gas
- Publication number 20020117222
- Publication date Aug 29, 2002
- NIPPON SANSO CORPORATION
- Tetsuya Satou
- G01 - MEASURING TESTING
Information Patent Application
Gas analyzing apparatus
- Publication number 20020108429
- Publication date Aug 15, 2002
- NIPPON SANSO CORPORATION
- Tsutomu Kikuchi
- G01 - MEASURING TESTING
Information Patent Application
System and process for analysis
- Publication number 20020111747
- Publication date Aug 15, 2002
- Akira Nishina
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZING APPARATUS
- Publication number 20020062680
- Publication date May 30, 2002
- Nippon Sanso Corporation
- Tsutomu Kikuchi
- G01 - MEASURING TESTING

Akira Nishina

Person

Patents Grantslast 30 patents

Method and an apparatus for analyzing trace impurities in gases

Gas analyzing apparatus

Apparatus and process for supplying gas

Gas supplying apparatus and gas substitution method

Method and apparatus for analyzing impurities in gases

System for analyzing trace amounts of impurities in gases

Gas analyzing apparatus

Multi-gas analysis system for analyzing high-purity gases

Method for analyzing impurities in gas and its analyzer

Patents Applicationslast 30 patents

Method and an apparatus for analyzing trace impurities in gases

Method and an apparatus for analyzing trace impurities in gases

Apparatus and process for supplying gas

Gas analyzing apparatus

System and process for analysis

GAS ANALYZING APPARATUS