Akira Noda

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Analysis data processing method and analysis data processing device
- Patent number 11,681,778
- Issue date Jun 20, 2023
- Shimadzu Corporation
- Akira Noda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Analysis-data analyzing device and analysis-data analyzing method t...
- Patent number 11,341,404
- Issue date May 24, 2022
- Shimadzu Corporation
- Akira Noda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chromatogram data processing method and device
- Patent number 10,725,000
- Issue date Jul 28, 2020
- Shimadzu Corporation
- Akira Noda
- G01 - MEASURING TESTING
Information Patent Grant
Chromatogram data processing system
- Patent number 10,429,365
- Issue date Oct 1, 2019
- Shimadzu Corporation
- Akira Noda
- G01 - MEASURING TESTING
Information Patent Grant
Chromatogram data processing method and chromatogram data processin...
- Patent number 10,416,134
- Issue date Sep 17, 2019
- Shimadzu Corporation
- Akira Noda
- G01 - MEASURING TESTING
Information Patent Grant
Peak waveform processing device
- Patent number 10,236,167
- Issue date Mar 19, 2019
- Shimadzu Corporation
- Akira Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Peak detection method
- Patent number 10,198,630
- Issue date Feb 5, 2019
- Shimadzu Corporation
- Akira Noda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectrum analysis apparatus and calibration method
- Patent number 10,161,793
- Issue date Dec 25, 2018
- Shimadzu Corporation
- Akira Noda
- G01 - MEASURING TESTING
Information Patent Grant
Multichannel spectrophotometer and data processing method for multi...
- Patent number 10,060,795
- Issue date Aug 28, 2018
- SHIMADZU CORPORATION
- Masahide Gunji
- G01 - MEASURING TESTING
Information Patent Grant
Analysis target region setting apparatus
- Patent number 9,995,922
- Issue date Jun 12, 2018
- Shimadzu Corporation
- Akira Noda
- G02 - OPTICS
Information Patent Grant
Chromatogram data processing method and device
- Patent number 9,500,629
- Issue date Nov 22, 2016
- Shimadzu Corporation
- Akira Noda
- G01 - MEASURING TESTING
Information Patent Grant
Data processing method
- Patent number 8,710,919
- Issue date Apr 29, 2014
- Shimadzu Corporation
- Akira Noda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Mass analysis data analyzing method and mass analysis data analyzin...
- Patent number 8,666,681
- Issue date Mar 4, 2014
- Shimadzu Corporation
- Akira Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for extracting charged particle beam and small-sized acceler...
- Patent number 5,576,602
- Issue date Nov 19, 1996
- Hitachi, Ltd.
- Kazuo Hiramoto
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
MODEL FUNCTION FITTING DEVICE AND MODEL FUNCTION FITTING METHOD
- Publication number 20240393302
- Publication date Nov 28, 2024
- Shimadzu Corporation
- Akira NODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAVEFORM SHAPE LEARNING DEVICE, WAVEFORM SHAPE LEARNING METHOD, NON...
- Publication number 20240264132
- Publication date Aug 8, 2024
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DATA ANALYSIS DEVICE, MEASUREMENT DATA ANALYSIS METHOD...
- Publication number 20240219204
- Publication date Jul 4, 2024
- Shimadzu Corporation
- Yusuke TAMAI
- G01 - MEASURING TESTING
Information Patent Application
CHROMATOGRAPHY QUALITY CONTROL DEVICE AND CHROMATOGRAPHY QUALITY CO...
- Publication number 20240011950
- Publication date Jan 11, 2024
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
PEAK TRACKING DEVICE, PEAK TRACKING METHOD AND PEAK TRACKING PROGRAM
- Publication number 20230204548
- Publication date Jun 29, 2023
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
WAVEFORM INFORMATION INFERENCE METHOD AND DEVICE, AND PEAK WAVEFORM...
- Publication number 20230160862
- Publication date May 25, 2023
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
PEAK TRACKING DEVICE, PEAK TRACKING METHOD AND PEAK TRACKING PROGRAM
- Publication number 20230131114
- Publication date Apr 27, 2023
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
PEAK AREA DISPLAY DEVICE, PEAK AREA DISPLAY METHOD, PEAK AREA CALCU...
- Publication number 20230126478
- Publication date Apr 27, 2023
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD AND DIAGNOSIS ASSISTANCE METHOD
- Publication number 20220382834
- Publication date Dec 1, 2022
- Shimadzu Corporation
- Yuichiro FUJITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONSECUTIVE APPROXIMATION CALCULATION METHOD, CONSECUTIVE APPROXIMA...
- Publication number 20220253508
- Publication date Aug 11, 2022
- SHIMADZU CORPORATION
- Yusuke TAGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Sample Measurement Device, Program, and Measurement Parameter Setti...
- Publication number 20210405002
- Publication date Dec 30, 2021
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
DATA ANALYZER
- Publication number 20210350283
- Publication date Nov 11, 2021
- SHIMADZU CORPORATION
- Yuichiro FUJITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data Analyzing Method, Data Analyzing Device, and Learning Model Cr...
- Publication number 20210319364
- Publication date Oct 14, 2021
- SHIMADZU CORPORATION
- Yuichiro FUJITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PUMP MONITORING DEVICE, VACUUM PROCESSING DEVICE, AND VACUUM PUMP
- Publication number 20200141415
- Publication date May 7, 2020
- Shimadzu Corporation
- Yusuke TAMAI
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
METHOD FOR SETTING ANALYSIS TARGET REGION BY EXTRACTING, FROM AN OB...
- Publication number 20190196170
- Publication date Jun 27, 2019
- Shimadzu Corporation
- Akira NODA
- G02 - OPTICS
Information Patent Application
ANALYSIS DATA PROCESSING METHOD AND ANALYSIS DATA PROCESSING DEVICE
- Publication number 20190179874
- Publication date Jun 13, 2019
- SHIMADZU CORPORATION
- Akira NODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHROMATOGRAM DATA PROCESSING METHOD AND DEVICE
- Publication number 20190011408
- Publication date Jan 10, 2019
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS-DATA ANALYZING DEVICE AND ANALYSIS-DATA ANALYZING METHOD
- Publication number 20180268293
- Publication date Sep 20, 2018
- SHIMADZU CORPORATION
- Akira NODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTRUM ANALYSIS APPARATUS AND CALIBRATION METHOD
- Publication number 20180087961
- Publication date Mar 29, 2018
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL SPECTROPHOTOMETER AND DATA PROCESSING METHOD FOR MULTI...
- Publication number 20180031423
- Publication date Feb 1, 2018
- Shimadzu Corporation
- Masahide GUNJI
- G01 - MEASURING TESTING
Information Patent Application
CHROMATOGRAM DATA PROCESSING METHOD AND CHROMATOGRAM DATA PROCESSIN...
- Publication number 20170336370
- Publication date Nov 23, 2017
- SHIMADZU CORPORATION
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
CHROMATOGRAM DATA PROCESSING SYSTEM
- Publication number 20160231297
- Publication date Aug 11, 2016
- SHIMADZU CORPORATION
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
PEAK DETECTION METHOD
- Publication number 20160224830
- Publication date Aug 4, 2016
- SHIMADZU CORPORATION
- Akira NODA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS TARGET REGION SETTING APPARATUS
- Publication number 20160011408
- Publication date Jan 14, 2016
- SHIMADZU CORPORATION
- Akira NODA
- G02 - OPTICS
Information Patent Application
SYSTEM FOR SETTING ANALYSIS TARGET REGION
- Publication number 20150301323
- Publication date Oct 22, 2015
- SHIMADZU CORPORATION
- Akira NODA
- G02 - OPTICS
Information Patent Application
CHROMATOGRAM DATA PROCESSING METHOD AND DEVICE
- Publication number 20140129169
- Publication date May 8, 2014
- Shimadzu Corporation
- Akira NODA
- G01 - MEASURING TESTING
Information Patent Application
Data Processing Method and System
- Publication number 20130181769
- Publication date Jul 18, 2013
- SHIMADZU CORPORATION
- Akira Noda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Analysis Data Analyzing Method and Mass Analysis Data Analyzin...
- Publication number 20110125416
- Publication date May 26, 2011
- SHIMADZU CORPORATION
- Akira Noda
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Analysis data processing method and analysis data processing device

Analysis-data analyzing device and analysis-data analyzing method t...

Chromatogram data processing method and device

Chromatogram data processing system

Chromatogram data processing method and chromatogram data processin...

Peak waveform processing device

Peak detection method

Spectrum analysis apparatus and calibration method

Multichannel spectrophotometer and data processing method for multi...

Analysis target region setting apparatus

Chromatogram data processing method and device

Data processing method

Mass analysis data analyzing method and mass analysis data analyzin...

Method for extracting charged particle beam and small-sized acceler...

Patents Applicationslast 30 patents

MODEL FUNCTION FITTING DEVICE AND MODEL FUNCTION FITTING METHOD

WAVEFORM SHAPE LEARNING DEVICE, WAVEFORM SHAPE LEARNING METHOD, NON...

MEASUREMENT DATA ANALYSIS DEVICE, MEASUREMENT DATA ANALYSIS METHOD...

CHROMATOGRAPHY QUALITY CONTROL DEVICE AND CHROMATOGRAPHY QUALITY CO...

PEAK TRACKING DEVICE, PEAK TRACKING METHOD AND PEAK TRACKING PROGRAM

WAVEFORM INFORMATION INFERENCE METHOD AND DEVICE, AND PEAK WAVEFORM...

PEAK TRACKING DEVICE, PEAK TRACKING METHOD AND PEAK TRACKING PROGRAM

PEAK AREA DISPLAY DEVICE, PEAK AREA DISPLAY METHOD, PEAK AREA CALCU...

ANALYSIS METHOD AND DIAGNOSIS ASSISTANCE METHOD

CONSECUTIVE APPROXIMATION CALCULATION METHOD, CONSECUTIVE APPROXIMA...

Sample Measurement Device, Program, and Measurement Parameter Setti...

DATA ANALYZER

Data Analyzing Method, Data Analyzing Device, and Learning Model Cr...

PUMP MONITORING DEVICE, VACUUM PROCESSING DEVICE, AND VACUUM PUMP

METHOD FOR SETTING ANALYSIS TARGET REGION BY EXTRACTING, FROM AN OB...

ANALYSIS DATA PROCESSING METHOD AND ANALYSIS DATA PROCESSING DEVICE

CHROMATOGRAM DATA PROCESSING METHOD AND DEVICE

ANALYSIS-DATA ANALYZING DEVICE AND ANALYSIS-DATA ANALYZING METHOD

SPECTRUM ANALYSIS APPARATUS AND CALIBRATION METHOD

MULTICHANNEL SPECTROPHOTOMETER AND DATA PROCESSING METHOD FOR MULTI...

CHROMATOGRAM DATA PROCESSING METHOD AND CHROMATOGRAM DATA PROCESSIN...

CHROMATOGRAM DATA PROCESSING SYSTEM

PEAK DETECTION METHOD

ANALYSIS TARGET REGION SETTING APPARATUS

SYSTEM FOR SETTING ANALYSIS TARGET REGION

CHROMATOGRAM DATA PROCESSING METHOD AND DEVICE

Data Processing Method and System

Mass Analysis Data Analyzing Method and Mass Analysis Data Analyzin...