Akira OHASHI

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Metal detection apparatus
- Patent number 10,996,363
- Issue date May 4, 2021
- ANRITSU INFIVIS CO., LTD.
- Yuki Hayakawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
METAL DETECTION APPARATUS
- Publication number 20200073007
- Publication date Mar 5, 2020
- ANRITSU INFIVIS CO., LTD.
- Yuki HAYAKAWA
- G01 - MEASURING TESTING