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Komoro, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Read and verify methodology and structure to counter gate SiO2 depe...
Patent number
11,551,768
Issue date
Jan 10, 2023
SanDisk Technologies LLC
Rajdeep Gautam
G11 - INFORMATION STORAGE
Information
Patent Grant
Evaluation apparatus of semiconductor device and method of evaluati...
Patent number
10,725,086
Issue date
Jul 28, 2020
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation apparatus including a plurality of insulating portions s...
Patent number
10,539,607
Issue date
Jan 21, 2020
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation apparatus for semiconductor device and evaluation method...
Patent number
10,495,668
Issue date
Dec 3, 2019
Mitsubishi Electric Corporation
Takaya Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation apparatus for semiconductor device and evaluation method...
Patent number
10,459,005
Issue date
Oct 29, 2019
Mitsubishi Electric Corporation
Takaya Noguchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Evaluation apparatus and evaluation method
Patent number
10,436,833
Issue date
Oct 8, 2019
Mitsubishi Electric Corporation
Akira Okada
G05 - CONTROLLING REGULATING
Information
Patent Grant
Device and method for inspecting position of probe, and semiconduct...
Patent number
10,359,448
Issue date
Jul 23, 2019
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and method for testing same
Patent number
10,228,412
Issue date
Mar 12, 2019
Mitsubishi Electric Corporation
Hajime Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wiring core structure, semiconductor evaluation device and semicond...
Patent number
10,224,388
Issue date
Mar 5, 2019
Mitsubishi Electric Corporation
Akira Okada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Probe position inspection apparatus, semiconductor device inspectio...
Patent number
10,209,273
Issue date
Feb 19, 2019
Mitsubishi Electric Corporation
Norihiro Takesako
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and electrical contact structure thereof
Patent number
10,192,797
Issue date
Jan 29, 2019
Mitsubishi Electric Corporation
Hajime Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device evaluation jig, semiconductor device evaluatio...
Patent number
10,168,380
Issue date
Jan 1, 2019
Mitsubishi Electric Corporation
Takaya Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for evaluating semiconductor device comprising...
Patent number
10,068,814
Issue date
Sep 4, 2018
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for evaluating semiconductor device
Patent number
9,995,786
Issue date
Jun 12, 2018
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device inspection apparatus and semiconductor device...
Patent number
9,880,196
Issue date
Jan 30, 2018
Mitsubishi Electric Corporation
Hajime Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Evaluation apparatus and probe position inspection method
Patent number
9,804,197
Issue date
Oct 31, 2017
Mitsubishi Electric Corporation
Norihiro Takesako
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor evaluation apparatus and semiconductor evaluation method
Patent number
9,720,014
Issue date
Aug 1, 2017
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and semiconductor module
Patent number
9,722,060
Issue date
Aug 1, 2017
Mitsubishi Electric Corporation
Hiroyuki Nakamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measuring apparatus and measuring method utilizing insulating liquid
Patent number
9,684,015
Issue date
Jun 20, 2017
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Measuring apparatus
Patent number
9,684,027
Issue date
Jun 20, 2017
Mitsubishi Electric Corporation
Takaya Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor evaluation apparatus
Patent number
9,678,143
Issue date
Jun 13, 2017
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Foreign matter removal device and foreign matter removal method
Patent number
9,659,795
Issue date
May 23, 2017
Mitsubishi Electric Corporation
Akira Okada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measurement device
Patent number
9,562,929
Issue date
Feb 7, 2017
Mitsubishi Electric Corporation
Takaya Noguchi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device assessment apparatus
Patent number
9,551,745
Issue date
Jan 24, 2017
Mitsubishi Electric Corporation
Hajime Akiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor testing jig and semiconductor testing method performe...
Patent number
9,347,988
Issue date
May 24, 2016
Mitsubishi Electric Corporation
Hajime Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor evaluating device and semiconductor evaluating method
Patent number
9,335,371
Issue date
May 10, 2016
Mitsubishi Electric Corporation
Hajime Akiyama
G01 - MEASURING TESTING
Information
Patent Grant
Wafer suction method, wafer suction stage, and wafer suction system
Patent number
9,312,160
Issue date
Apr 12, 2016
Mitsubishi Electric Corporation
Hajime Akiyama
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information
Patent Grant
Semiconductor testing jig and transfer jig for the same
Patent number
9,257,316
Issue date
Feb 9, 2016
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus
Patent number
9,207,257
Issue date
Dec 8, 2015
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus
Patent number
9,188,624
Issue date
Nov 17, 2015
Mitsubishi Electric Corporation
Akira Okada
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
READ AND VERIFY METHODOLOGY AND STRUCTURE TO COUNTER GATE SiO2 DEPE...
Publication number
20220148665
Publication date
May 12, 2022
SANDISK TECHNOLOGIES LLC
Rajdeep Gautam
G11 - INFORMATION STORAGE
Information
Patent Application
EVALUATION APPARATUS OF SEMICONDUCTOR DEVICE AND METHOD OF EVALUATI...
Publication number
20180180659
Publication date
Jun 28, 2018
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
EVALUATION APPARATUS AND EVALUATION METHOD
Publication number
20180180660
Publication date
Jun 28, 2018
Mitsubishi Electric Corporation
Akira OKADA
G05 - CONTROLLING REGULATING
Information
Patent Application
SEMICONDUCTOR DEVICE EVALUATION JIG, SEMICONDUCTOR DEVICE EVALUATIO...
Publication number
20180088169
Publication date
Mar 29, 2018
Mitsubishi Electric Corporation
Takaya NOGUCHI
G01 - MEASURING TESTING
Information
Patent Application
EVALUATION APPARATUS AND SEMICONDUCTOR DEVICE EVALUATION METHOD
Publication number
20180088170
Publication date
Mar 29, 2018
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR INSPECTING POSITION OF PROBE, AND SEMICONDUCT...
Publication number
20170299630
Publication date
Oct 19, 2017
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE INSPECTION APPARATUS AND SEMICONDUCTOR DEVICE...
Publication number
20170205442
Publication date
Jul 20, 2017
Mitsubishi Electric Corporation
Hajime AKIYAMA
G01 - MEASURING TESTING
Information
Patent Application
EVALUATION APPARATUS AND PROBE POSITION INSPECTION METHOD
Publication number
20170199225
Publication date
Jul 13, 2017
Mitsubishi Electric Corporation
Norihiro TAKESAKO
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR EVALUATING SEMICONDUCTOR DEVICE
Publication number
20170139002
Publication date
May 18, 2017
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
EVALUATION APPARATUS FOR SEMICONDUCTOR DEVICE AND EVALUATION METHOD...
Publication number
20170138984
Publication date
May 18, 2017
Mitsubishi Electric Corporation
Takaya NOGUCHI
G01 - MEASURING TESTING
Information
Patent Application
PROBE POSITION INSPECTION APPARATUS, SEMICONDUCTOR DEVICE INSPECTIO...
Publication number
20170102410
Publication date
Apr 13, 2017
Mitsubishi Electric Corporation
Norihiro TAKESAKO
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR EVALUATING SEMICONDUCTOR DEVICE
Publication number
20170092553
Publication date
Mar 30, 2017
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
CONTACT-PROBE TYPE TEMPERATURE DETECTOR, SEMICONDUCTOR DEVICE EVALU...
Publication number
20160377486
Publication date
Dec 29, 2016
Mitsubishi Electric Corporation
Kinya YAMASHITA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20160343627
Publication date
Nov 24, 2016
Mitsubishi Electric Corporation
Hajime AKIYAMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SAME
Publication number
20160334458
Publication date
Nov 17, 2016
Mitsubishi Electric Corporation
Hajime AKIYAMA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MODULE
Publication number
20160240637
Publication date
Aug 18, 2016
Mitsubishi Electric Corporation
Hiroyuki NAKAMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR EVALUATION APPARATUS AND SEMICONDUCTOR EVALUATION METHOD
Publication number
20160116501
Publication date
Apr 28, 2016
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
WIRING CORE STRUCTURE, SEMICONDUCTOR EVALUATION DEVICE AND SEMICOND...
Publication number
20160054376
Publication date
Feb 25, 2016
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS
Publication number
20150362549
Publication date
Dec 17, 2015
Mitsubishi Electric Corporation
Takaya NOGUCHI
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS AND MEASURING METHOD
Publication number
20150362527
Publication date
Dec 17, 2015
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT DEVICE
Publication number
20150331011
Publication date
Nov 19, 2015
Mitsubishi Electric Corporation
Takaya NOGUCHI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR EVALUATION APPARATUS
Publication number
20150115989
Publication date
Apr 30, 2015
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR TESTING JIG AND TRANSFER JIG FOR THE SAME
Publication number
20150091599
Publication date
Apr 2, 2015
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND TEST METHOD
Publication number
20150044788
Publication date
Feb 12, 2015
Mitsubishi Electric Corporation
Akira OKADA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE ASSESSMENT APPARATUS
Publication number
20140347081
Publication date
Nov 27, 2014
Mitsubishi Electric Corporation
Hajime AKIYAMA
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20140346514
Publication date
Nov 27, 2014
MITSUBISHI ELECTRIC CORPORATION
Hajime Akiyama
B82 - NANO-TECHNOLOGY
Information
Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20140342544
Publication date
Nov 20, 2014
Mitsubishi Electric Corporation
Hajime AKIYAMA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR EVALUATING DEVICE AND SEMICONDUCTOR EVALUATING METHOD
Publication number
20140210500
Publication date
Jul 31, 2014
Mitsubishi Electric Corporation
Hajime AKIYAMA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
Publication number
20140199823
Publication date
Jul 17, 2014
Mitsubishi Electric Corporation
Noritsugu Nomura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20140077284
Publication date
Mar 20, 2014
Hajime AKIYAMA
H01 - BASIC ELECTRIC ELEMENTS