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Akira Ooide

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  • Tokyo-to, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Illuminance measuring system
    • Patent number 10,067,233
    • Issue date Sep 4, 2018
    • TOPCON Corporation
    • Hisashi Isozaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Illuminance measuring system
    • Patent number 9,823,354
    • Issue date Nov 21, 2017
    • TOPCON Corporation
    • Hisashi Isozaki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Illuminance Measuring System
    • Publication number 20180045829
    • Publication date Feb 15, 2018
    • TOPCON Corporation
    • Hisashi Isozaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Illuminance Measuring System
    • Publication number 20170023351
    • Publication date Jan 26, 2017
    • TOPCON Corporation
    • Hisashi Isozaki
    • G01 - MEASURING TESTING