Akira OONO

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Chargeable battery abnormality detection apparatus and chargeable b...
- Patent number 11,796,600
- Issue date Oct 24, 2023
- Furukawa Electric Co., Ltd.
- Akira Oono
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chargeable battery abnormality detection apparatus and chargeable b...
- Patent number 11,269,014
- Issue date Mar 8, 2022
- Furukawa Electric Co., Ltd.
- Akira Oono
- G01 - MEASURING TESTING
Information Patent Grant
Device for estimating degradation of secondary cell, and method for...
- Patent number 11,143,710
- Issue date Oct 12, 2021
- Furukawa Electric Co., Ltd.
- Taiji Mitsuyama
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGEABLE BATTERY ABNORMALITY DETECTION APPARATUS AND CHARGEABLE B...
- Publication number 20220146584
- Publication date May 12, 2022
- FURUKAWA ELECTRIC CO., LTD.
- Akira OONO
- G01 - MEASURING TESTING
Information Patent Application
CHARGEABLE BATTERY ABNORMALITY DETECTION APPARATUS AND CHARGEABLE B...
- Publication number 20200326378
- Publication date Oct 15, 2020
- FURUKAWA ELECTRIC CO., LTD.
- Akira OONO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE FOR ESTIMATING DEGRADATION OF SECONDARY CELL, AND METHOD FOR...
- Publication number 20190033392
- Publication date Jan 31, 2019
- FURUKAWA ELECTRIC CO., LTD.
- Taiji MITSUYAMA
- G01 - MEASURING TESTING