Akira Saito

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope system
- Patent number 7,770,232
- Issue date Aug 3, 2010
- Riken
- Akira Saito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning Probe Microscope System
- Publication number 20080258059
- Publication date Oct 23, 2008
- Riken
- Akira Saito
- G01 - MEASURING TESTING