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Akira Shimase
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Analysis method, analysis device, analysis program, and recording m...
Patent number
11,579,184
Issue date
Feb 14, 2023
Hamamatsu Photonics K.K.
Akira Shimase
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement method, optical measurement device, optical mea...
Patent number
11,181,361
Issue date
Nov 23, 2021
Hamamatsu Photonics K.K.
Akira Shimase
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device inspection apparatus and semiconductor device...
Patent number
10,955,458
Issue date
Mar 23, 2021
Hamamatsu Photonics K.K.
Toru Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method, inspection device, and marking forming method
Patent number
10,923,404
Issue date
Feb 16, 2021
Hamamatsu Photonics K.K.
Shinsuke Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection method, inspection device, and marking forming method
Patent number
10,586,743
Issue date
Mar 10, 2020
Hamamatsu Photonics K.K.
Shinsuke Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor failure analysis apparatus which acquires a failure o...
Patent number
7,865,012
Issue date
Jan 4, 2011
Hamamatsu Photonics K.K.
Toshiyuki Majima
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor failure analysis apparatus, failure analysis method,...
Patent number
7,805,691
Issue date
Sep 28, 2010
Hamamatsu Photonics K.K.
Toshiyuki Majima
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR INSPECTING METHOD AND SEMICONDUCTOR INSPECTING DEVICE
Publication number
20230206422
Publication date
Jun 29, 2023
Hamamatsu Photonics K.K.
Akira SHIMASE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
Publication number
20230184827
Publication date
Jun 15, 2023
Hamamatsu Photonics K.K.
Norimichi CHINONE
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INS...
Publication number
20230184825
Publication date
Jun 15, 2023
Hamamatsu Photonics K.K.
Norimichi CHINONE
G01 - MEASURING TESTING
Information
Patent Application
WAFER CONVEYANCE UNIT AND WAFER CONVEYANCE METHOD
Publication number
20220406644
Publication date
Dec 22, 2022
Hamamatsu Photonics K.K.
Akira SHIMASE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANALYSIS METHOD, ANALYSIS DEVICE, ANALYSIS PROGRAM, AND RECORDING M...
Publication number
20210373071
Publication date
Dec 2, 2021
Hamamatsu Photonics K.K.
Akira SHIMASE
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL MEASUREMENT METHOD, OPTICAL MEASUREMENT DEVICE, OPTICAL MEA...
Publication number
20200333134
Publication date
Oct 22, 2020
Hamamatsu Photonics K.K.
Akira SHIMASE
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION METHOD, INSPECTION DEVICE, AND MARKING FORMING METHOD
Publication number
20200152525
Publication date
May 14, 2020
HAMAMATSU PHOTONICS K. K.
Shinsuke SUZUKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INSPECTION METHOD, INSPECTION DEVICE, AND MARKING FORMING METHOD
Publication number
20190371682
Publication date
Dec 5, 2019
Hamamatsu Photonics K.K.
Shinsuke SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE INSPECTION APPARATUS AND SEMICONDUCTOR DEVICE...
Publication number
20190271734
Publication date
Sep 5, 2019
Hamamatsu Photonics K.K.
Toru MATSUMOTO
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
Publication number
20070294053
Publication date
Dec 20, 2007
Hamamatsu Photonics K.K.
Toshiyuki Majima
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
Publication number
20070292018
Publication date
Dec 20, 2007
Hamamatsu Photonics K.K.
Toshiyuki Majima
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
Publication number
20070290696
Publication date
Dec 20, 2007
Hamamatsu Photonics K.K.
Toshiyuki Majima
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
Publication number
20070020781
Publication date
Jan 25, 2007
Hamamatsu Photonics K.K.
Toshiyuki Majima
G06 - COMPUTING CALCULATING COUNTING