Akira SOMA

Person

Aomori, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electrical test probe and probe assembly with improved probe tip
- Patent number 8,975,908
- Issue date Mar 10, 2015
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a probe
- Patent number 7,862,733
- Issue date Jan 4, 2011
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Contact for electrical test, electrical connecting apparatus using...
- Patent number 7,816,931
- Issue date Oct 19, 2010
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing an electrical test probe
- Patent number 7,736,690
- Issue date Jun 15, 2010
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing a probe
- Patent number 7,721,429
- Issue date May 25, 2010
- Kabushiki Kaisha Nihon Micronics
- Akira Soma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe for electrical test and electrical connecting apparatus using it
- Patent number 7,679,389
- Issue date Mar 16, 2010
- Kabushiki Kaisha Nihon Micronics
- Shinji Kuniyoshi
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe
- Patent number 7,629,807
- Issue date Dec 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Electrical test probe and electrical test probe assembly
- Patent number 7,586,321
- Issue date Sep 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of manufacturing a probe
- Patent number 7,523,539
- Issue date Apr 28, 2009
- Kabushiki Kaisha Nihon Micronics
- Takayuki Hayashizaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL TEST PROBE AND PROBE ASSEMBLY
- Publication number 20120068726
- Publication date Mar 22, 2012
- Kabushiki Kaisha Nihon Micronics
- Takayuki HAYASHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
CONTACT FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USING...
- Publication number 20090230982
- Publication date Sep 17, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST PROBE
- Publication number 20090058441
- Publication date Mar 5, 2009
- KABUSHIKI KAISHA NIHON MICRONICS
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT
- Publication number 20090051382
- Publication date Feb 26, 2009
- Kabushiki Kaisha Nihon Micronics
- Shinji KUNIYOSHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING A PROBE
- Publication number 20080210663
- Publication date Sep 4, 2008
- Kabushiki Kaisha Nihon Micronics
- Takayuki HAYASHIZAKI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR MANUFACTURING A PROBE
- Publication number 20080184559
- Publication date Aug 7, 2008
- Kabushiki Kaisha Nihon Micronics
- Akira SOMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL TEST PROBE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080186038
- Publication date Aug 7, 2008
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
PROBE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20080143368
- Publication date Jun 19, 2008
- Kabushiki Kaisha Nihon Micronics
- Takayuki HAYASHIZAKI
- G01 - MEASURING TESTING
Information Patent Application
ELECTRICAL TEST PROBE AND ELECTRICAL TEST PROBE ASSEMBLY
- Publication number 20080074128
- Publication date Mar 27, 2008
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Electrical test probe and probe assembly with improved probe tip

Method for manufacturing a probe

Contact for electrical test, electrical connecting apparatus using...

Method for manufacturing an electrical test probe

Method for manufacturing a probe

Probe for electrical test and electrical connecting apparatus using it

Electrical test probe

Electrical test probe and electrical test probe assembly

Method of manufacturing a probe

Patents Applicationslast 30 patents

ELECTRICAL TEST PROBE AND PROBE ASSEMBLY

CONTACT FOR ELECTRICAL TEST, ELECTRICAL CONNECTING APPARATUS USING...

ELECTRICAL TEST PROBE

PROBE FOR ELECTRICAL TEST AND ELECTRICAL CONNECTING APPARATUS USING IT

METHOD FOR MANUFACTURING A PROBE

METHOD FOR MANUFACTURING A PROBE

ELECTRICAL TEST PROBE AND METHOD FOR MANUFACTURING THE SAME

PROBE AND METHOD FOR MANUFACTURING THE SAME

ELECTRICAL TEST PROBE AND ELECTRICAL TEST PROBE ASSEMBLY