Akira Souma

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Musashino, JP

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Patents Grantslast 30 patents

Information Patent Grant
Contact probe and probe card
- Patent number 9,146,257
- Issue date Sep 29, 2015
- Kabushiki Kaisha Nihon Micronics
- Masatomo Uebayashi
- G01 - MEASURING TESTING
Information Patent Grant
Electric contact
- Patent number D702646
- Issue date Apr 15, 2014
- Kabushiki Kaisha Nihon Micronics
- Masatomo Uebayashi
- D13 - Equipment for production, distribution, or transformation of energy
Information Patent Grant
Current test probe having a solder guide portion, and related probe...
- Patent number 7,888,958
- Issue date Feb 15, 2011
- Kabushiki Kaisha Nihon Micronics
- Akira Souma
- G01 - MEASURING TESTING
Information Patent Grant
Probe for electrical test and probe assembly
- Patent number 7,557,593
- Issue date Jul 7, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTACT PROBE AND PROBE CARD
- Publication number 20140043055
- Publication date Feb 13, 2014
- Kabushiki Kaisha Nihon Micronics
- Masatomo UEBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR CURRENT TEST, PROBE ASSEMBLY AND PRODUCTION METHOD THEREOF
- Publication number 20100213956
- Publication date Aug 26, 2010
- KABUSHIKI KAISHA NIHON MICRONICS
- Akira Souma
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST
- Publication number 20090009197
- Publication date Jan 8, 2009
- Kabushiki Kaisha Nihon Micronics
- Hideki HIRAKAWA
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR ELECTRICAL TEST AND PROBE ASSEMBLY
- Publication number 20070210813
- Publication date Sep 13, 2007
- KABUSHIKI KAISHA NIHON MICRONICS
- Hideki Hirakawa
- G01 - MEASURING TESTING
Information Patent Application
Probe use in electric test
- Publication number 20070018633
- Publication date Jan 25, 2007
- Kabushiki Kaisha Nihon Micronics
- Hideki Hirakawa
- G01 - MEASURING TESTING