Akira TAKADA

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image measuring method and apparatus
- Patent number 11,257,205
- Issue date Feb 22, 2022
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hardness test apparatus and hardness testing method
- Patent number 10,163,201
- Issue date Dec 25, 2018
- Mitutoyo Corporation
- Takeshi Sawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Edge detection bias correction value calculation method, edge detec...
- Patent number 10,102,631
- Issue date Oct 16, 2018
- Mitutoyo Corporation
- Hiroyuki Yoshida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hardness test apparatus and hardness testing method
- Patent number 10,024,774
- Issue date Jul 17, 2018
- Mitutoyo Corporation
- Fumihiko Koshimizu
- G01 - MEASURING TESTING
Information Patent Grant
Image measuring apparatus
- Patent number 10,027,885
- Issue date Jul 17, 2018
- Mitutoyo Corporation
- Gyokubu Cho
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Hardness test apparatus and hardness testing method
- Patent number 10,001,432
- Issue date Jun 19, 2018
- Mitutoyo Corporation
- Eiji Furuta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Machine vision system program editing environment including synchro...
- Patent number 9,013,574
- Issue date Apr 21, 2015
- Mitutoyo Corporation
- Barry Saylor
- G05 - CONTROLLING REGULATING
Information Patent Grant
Machine vision system program editing environment including real ti...
- Patent number 8,957,960
- Issue date Feb 17, 2015
- Mitutoyo Corporation
- Barry Saylor
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for generating part programs for use in image-...
- Patent number 6,968,080
- Issue date Nov 22, 2005
- Mitutoyo Corporation
- Akira Takada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Part program generating apparatus and program for image measuring a...
- Patent number 6,600,808
- Issue date Jul 29, 2003
- Mitutoyo Corporation
- Akira Takada
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
ABNORMALITY DETERMINATION APPARATUS, ABNORMALITY DETERMINATION METH...
- Publication number 20220349694
- Publication date Nov 3, 2022
- MITUTOYO CORPORATION
- Yo TERASHITA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASURING METHOD AND IMAGE MEASURING DEVICE
- Publication number 20170178315
- Publication date Jun 22, 2017
- MITUTOYO CORPORATION
- Gyokubu CHO
- G01 - MEASURING TESTING
Information Patent Application
HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD
- Publication number 20170074765
- Publication date Mar 16, 2017
- MITUTOYO CORPORATION
- Fumihiko KOSHIMIZU
- G01 - MEASURING TESTING
Information Patent Application
HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD
- Publication number 20170074764
- Publication date Mar 16, 2017
- MITUTOYO CORPORATION
- Eiji FURUTA
- G01 - MEASURING TESTING
Information Patent Application
HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD
- Publication number 20170076436
- Publication date Mar 16, 2017
- MITUTOYO CORPORATION
- Takeshi SAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EDGE DETECTION BIAS CORRECTION VALUE CALCULATION METHOD, EDGE DETEC...
- Publication number 20160295207
- Publication date Oct 6, 2016
- MITUTOYO CORPORATION
- Hiroyuki YOSHIDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASUREMENT APPARATUS AND GUIDANCE DISPLAY METHOD OF IMAGE ME...
- Publication number 20160093068
- Publication date Mar 31, 2016
- MITUTOYO CORPORATION
- Yu SUGAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING APPARATUS
- Publication number 20160019687
- Publication date Jan 21, 2016
- MITUTOYO CORPORATION
- Gyokubu CHO
- G02 - OPTICS
Information Patent Application
IMAGE MEASURING APPARATUS
- Publication number 20160021306
- Publication date Jan 21, 2016
- MITUTOYO CORPORATION
- Gyokubu CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE MEASURING DEVICE
- Publication number 20150287177
- Publication date Oct 8, 2015
- MITUTOYO CORPORATION
- Makoto KAIEDA
- G01 - MEASURING TESTING
Information Patent Application
MACHINE VISION SYSTEM PROGRAM EDITING ENVIRONMENT INCLUDING REAL TI...
- Publication number 20130123945
- Publication date May 16, 2013
- Mitutoyo Corporation
- Barry Saylor
- G01 - MEASURING TESTING
Information Patent Application
Machine Vision System Program Editing Environment Including Synchro...
- Publication number 20130125044
- Publication date May 16, 2013
- Mitutoyo Corporation
- Barry Saylor
- G01 - MEASURING TESTING
Information Patent Application
Part program generating apparatus and program for image measuring a...
- Publication number 20030039334
- Publication date Feb 27, 2003
- Mitutoyo Corporation
- Akira Takada
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for generating part programs for use in image-...
- Publication number 20010040995
- Publication date Nov 15, 2001
- Mitutoyo Corporation
- Akira Takada
- G06 - COMPUTING CALCULATING COUNTING

Akira TAKADA

Person

Patents Grantslast 30 patents

Image measuring method and apparatus

Hardness test apparatus and hardness testing method

Edge detection bias correction value calculation method, edge detec...

Hardness test apparatus and hardness testing method

Image measuring apparatus

Hardness test apparatus and hardness testing method

Machine vision system program editing environment including synchro...

Machine vision system program editing environment including real ti...

Method and apparatus for generating part programs for use in image-...

Part program generating apparatus and program for image measuring a...

Patents Applicationslast 30 patents

ABNORMALITY DETERMINATION APPARATUS, ABNORMALITY DETERMINATION METH...

IMAGE MEASURING METHOD AND IMAGE MEASURING DEVICE

HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD

HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD

HARDNESS TEST APPARATUS AND HARDNESS TESTING METHOD

EDGE DETECTION BIAS CORRECTION VALUE CALCULATION METHOD, EDGE DETEC...

IMAGE MEASUREMENT APPARATUS AND GUIDANCE DISPLAY METHOD OF IMAGE ME...

IMAGE MEASURING APPARATUS

IMAGE MEASURING APPARATUS

IMAGE MEASURING DEVICE

MACHINE VISION SYSTEM PROGRAM EDITING ENVIRONMENT INCLUDING REAL TI...

Machine Vision System Program Editing Environment Including Synchro...

Part program generating apparatus and program for image measuring a...

Method and apparatus for generating part programs for use in image-...