Akira Takada

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical scanner
- Patent number 12,066,739
- Issue date Aug 20, 2024
- Topcon Corporation
- Akira Takada
- G02 - OPTICS
Information Patent Grant
Spectrum measurement method and spectrum measurement device
- Patent number 11,815,399
- Issue date Nov 14, 2023
- Topcon Corporation
- Akira Takada
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating interferometer and interferometer using the same
- Patent number 10,295,328
- Issue date May 21, 2019
- Kabushiki Kaisha Topcon
- Akira Takada
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for optical interferometric measurement and method for th...
- Patent number 9,423,236
- Issue date Aug 23, 2016
- Kabushiki Kaisha Topcon
- Akira Takada
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Mask blanks
- Patent number 8,323,856
- Issue date Dec 4, 2012
- Asahi Glass Company, Limited
- Shinya Kikugawa
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Optical apparatus, photomask inspecting apparatus, and exposure app...
- Patent number 7,649,625
- Issue date Jan 19, 2010
- Kabushiki Kaisha Topcon
- Akira Takada
- G01 - MEASURING TESTING
Information Patent Grant
Silica glass and optical material
- Patent number 7,585,800
- Issue date Sep 8, 2009
- Asahi Glass Company, Limited
- Mitsuhiro Kawata
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Optical branching device
- Patent number 7,561,768
- Issue date Jul 14, 2009
- Kabushiki Kaisha Topcon
- Akira Takada
- G02 - OPTICS
Information Patent Grant
Optical fiber cable
- Patent number 7,309,168
- Issue date Dec 18, 2007
- Kabushiki Kaisha Topcon
- Masayuki Momiuchi
- G02 - OPTICS
Information Patent Grant
Process for forming a glass sheet
- Patent number 6,311,523
- Issue date Nov 6, 2001
- Asahi Glass Company Ltd.
- Gen Kojima
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Process for forming a glass sheet
- Patent number 6,101,845
- Issue date Aug 15, 2000
- Asahi Glass Company Ltd.
- Gen Kojima
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Signal formation apparatus for use in interference measurement
- Patent number 6,075,600
- Issue date Jun 13, 2000
- Kabushiki Kaisha Topcon
- Shigenori Nagano
- G01 - MEASURING TESTING
Information Patent Grant
Glass composition and substrate for plasma display
- Patent number 5,780,373
- Issue date Jul 14, 1998
- Asahi Glass Company Ltd.
- Osamu Yanagisawa
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Abrasion resistant glass
- Patent number 5,741,745
- Issue date Apr 21, 1998
- Asahi Glass Company Ltd.
- Jeetendra Sehgal
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Abrasion resistant glass
- Patent number 5,721,181
- Issue date Feb 24, 1998
- Asahi Glass Company Ltd.
- Jeetendra Sehgal
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Glass composition and substrate for plasma display
- Patent number 5,631,195
- Issue date May 20, 1997
- Asahi Glass Company Ltd.
- Osamu Yanagisawa
- C03 - GLASS MINERAL OR SLAG WOOL

Patents Applicationslast 30 patents

Information Patent Application
SPECTRUM MEASUREMENT METHOD AND SPECTRUM MEASUREMENT DEVICE
- Publication number 20220291043
- Publication date Sep 15, 2022
- TOPCON CORPORATION
- Akira TAKADA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INTERFERENCE MEASUREMENT DEVICE
- Publication number 20220206164
- Publication date Jun 30, 2022
- TOPCON CORPORATION
- Akira TAKADA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SCANNER
- Publication number 20220171253
- Publication date Jun 2, 2022
- TOPCON CORPORATION
- Akira TAKADA
- G02 - OPTICS
Information Patent Application
METHOD OF CALIBRATING INTERFEROMETER AND INTERFEROMETER USING THE SAME
- Publication number 20160363434
- Publication date Dec 15, 2016
- KABUSHIKI KAISHA TOPCON
- Akira TAKADA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR OPTICAL INTERFEROMETRIC MEASUREMENT AND METHOD FOR TH...
- Publication number 20150345931
- Publication date Dec 3, 2015
- KABUSHIKI KAISHA TOPCON
- Akira Takada
- G01 - MEASURING TESTING
Information Patent Application
MODE-LOCKED LASER LIGHT SOURCE DEVICE AND OPTICAL COHERENCE TOMOGRA...
- Publication number 20150002851
- Publication date Jan 1, 2015
- KABUSHIKI KAISHA TOPCON
- Akira Takada
- G01 - MEASURING TESTING
Information Patent Application
MASK BLANKS
- Publication number 20110053059
- Publication date Mar 3, 2011
- Asahi Glass Co., LTD.
- Shinya KIKUGAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CIRCUIT PATTERN DEFECT DETECTION APPARATUS, CIRCUIT PATTERN DEFECT...
- Publication number 20100321680
- Publication date Dec 23, 2010
- Akira Takada
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS, PHOTOMASK INSPECTING APPARATUS, AND EXPOSURE APP...
- Publication number 20090244531
- Publication date Oct 1, 2009
- Akira Takada
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL BRANCHING DEVICE
- Publication number 20080219679
- Publication date Sep 11, 2008
- Akira Takada
- G02 - OPTICS
Information Patent Application
SILICA GLASS AND OPTICAL MATERIAL
- Publication number 20080103038
- Publication date May 1, 2008
- Asahi Glass Co., LTD.
- Mitsuhiro Kawata
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Application
MASK BLANKS
- Publication number 20080032213
- Publication date Feb 7, 2008
- Asahi Glass Co., LTD.
- Shinya KIKUGAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical fiber cable
- Publication number 20070147742
- Publication date Jun 28, 2007
- Kabushiki Kaisha TOPCON
- Masayuki Momiuchi
- G02 - OPTICS
Information Patent Application
Pattern defect inspection method and apparatus
- Publication number 20060239535
- Publication date Oct 26, 2006
- Kabushiki Kaisha TOPCON
- Akira Takada
- G06 - COMPUTING CALCULATING COUNTING

Akira Takada

Person

Patents Grantslast 30 patents

Optical scanner

Spectrum measurement method and spectrum measurement device

Method of calibrating interferometer and interferometer using the same

Apparatus for optical interferometric measurement and method for th...

Mask blanks

Optical apparatus, photomask inspecting apparatus, and exposure app...

Silica glass and optical material

Optical branching device

Optical fiber cable

Process for forming a glass sheet

Process for forming a glass sheet

Signal formation apparatus for use in interference measurement

Glass composition and substrate for plasma display

Abrasion resistant glass

Abrasion resistant glass

Glass composition and substrate for plasma display

Patents Applicationslast 30 patents

SPECTRUM MEASUREMENT METHOD AND SPECTRUM MEASUREMENT DEVICE

OPTICAL INTERFERENCE MEASUREMENT DEVICE

OPTICAL SCANNER

METHOD OF CALIBRATING INTERFEROMETER AND INTERFEROMETER USING THE SAME

APPARATUS FOR OPTICAL INTERFEROMETRIC MEASUREMENT AND METHOD FOR TH...

MODE-LOCKED LASER LIGHT SOURCE DEVICE AND OPTICAL COHERENCE TOMOGRA...

MASK BLANKS

CIRCUIT PATTERN DEFECT DETECTION APPARATUS, CIRCUIT PATTERN DEFECT...

OPTICAL APPARATUS, PHOTOMASK INSPECTING APPARATUS, AND EXPOSURE APP...

OPTICAL BRANCHING DEVICE

SILICA GLASS AND OPTICAL MATERIAL

MASK BLANKS

Optical fiber cable

Pattern defect inspection method and apparatus