Akira Takeshima

Person

Shizuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Voltage measuring using electro-optic material's change in refracti...
- Patent number 5,666,062
- Issue date Sep 9, 1997
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Voltage measurement system
- Patent number 5,631,555
- Issue date May 20, 1997
- Hamamatsu Photonics K.K.
- Hironori Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical feedback photodetection apparatus
- Patent number 5,614,708
- Issue date Mar 25, 1997
- Hamamatsu Photonics K.K.
- Musubu Koishi
- G02 - OPTICS
Information Patent Grant
Synchronous signal detection apparatus with a photoconductive photo...
- Patent number 5,591,962
- Issue date Jan 7, 1997
- Hamamatsu Photonics K.K.
- Musubu Koishi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Decay characteristic measuring apparatus
- Patent number 5,548,124
- Issue date Aug 20, 1996
- Hamamatsu Photonics K.K.
- Akira Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring apparatus
- Patent number 5,534,992
- Issue date Jul 9, 1996
- Hamamatsu Photonics K.K.
- Akira Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Optical frequency mixing apparatus
- Patent number 5,535,044
- Issue date Jul 9, 1996
- Hamamatsu Photonics K.K.
- Akira Takeshima
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Phase difference detecting method, circuit and apparatus
- Patent number 5,495,100
- Issue date Feb 27, 1996
- Hamamatsu Photonics, K.K.
- Akira Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for distance measurement using electromagnetic...
- Patent number 5,044,744
- Issue date Sep 3, 1991
- Hamamatsu Photonics K.K.
- Ichizo Ogawa
- G01 - MEASURING TESTING
Information Patent Grant
Deflecting voltage generating circuit
- Patent number 4,914,359
- Issue date Apr 3, 1990
- Hamamatsu Photonics Kabushiki Kaisha
- Akira Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Time interval measuring device
- Patent number 4,827,317
- Issue date May 2, 1989
- Hamamatsu Photonics Kabushiki Kaisha
- Yoshihiko Mizushima
- G01 - MEASURING TESTING
Information Patent Grant
Laser pulse train jitter measuring device
- Patent number 4,705,397
- Issue date Nov 10, 1987
- Hamamatsu Photonics Kabushiki Kaisha
- Yutaka Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Instruments for measuring light pulses clocked at high repetition r...
- Patent number 4,694,154
- Issue date Sep 15, 1987
- Hamamatsu Photonics Kabushiki Kaisha
- Yutaka Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Instruments for measuring light pulses clocked at high repetition r...
- Patent number 4,645,918
- Issue date Feb 24, 1987
- Hamamatsu Photonics Kabushiki Kaisha
- Yutaka Tsuchiya
- G01 - MEASURING TESTING

Akira Takeshima

Person

Patents Grantslast 30 patents

Voltage measuring using electro-optic material's change in refracti...

Voltage measurement system

Optical feedback photodetection apparatus

Synchronous signal detection apparatus with a photoconductive photo...

Decay characteristic measuring apparatus

Optical measuring apparatus

Optical frequency mixing apparatus

Phase difference detecting method, circuit and apparatus

Method and apparatus for distance measurement using electromagnetic...

Deflecting voltage generating circuit

Time interval measuring device

Laser pulse train jitter measuring device

Instruments for measuring light pulses clocked at high repetition r...

Instruments for measuring light pulses clocked at high repetition r...