Akira Umeda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Dynamic matrix sensitivity measuring instrument for inertial sensor...
- Patent number 7,680,620
- Issue date Mar 16, 2010
- National Institute of Advanced Industrial Science and Technology
- Akira Umeda
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring transverse sensitivity of sensor for detecting...
- Patent number 7,644,602
- Issue date Jan 12, 2010
- National Institute of Advanced Industrial Science and Technology
- Akira Umeda
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring dynamic linearity of acceleration s...
- Patent number 7,343,776
- Issue date Mar 18, 2008
- National Institute of Advanced Industrial Science and Technology
- Akira Umeda
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring frequency characteristics of acc...
- Patent number 7,318,337
- Issue date Jan 15, 2008
- National Institute of Advanced Industrial Science and Technology
- Akira Umeda
- G01 - MEASURING TESTING
Information Patent Grant
Frequency characteristics measuring method and device for accelerat...
- Patent number 7,165,440
- Issue date Jan 23, 2007
- National Institute of Advanced Industrial Science and Technology
- Akira Umeda
- G01 - MEASURING TESTING
Information Patent Grant
Calibration evaluation method and device for acceleration sensor
- Patent number 7,076,991
- Issue date Jul 18, 2006
- National Institute of Advanced Industrial Science and Technology
- Akira Umeda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of Measuring Transverse Sensitivity of Sensor for Detecting...
- Publication number 20070295087
- Publication date Dec 27, 2007
- Akira Umeda
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring frequency characteristics of acc...
- Publication number 20060260398
- Publication date Nov 23, 2006
- NAT. INST. OF ADVANCED INDUSTR. SCIENCE AND TECH.
- Akira Umeda
- G01 - MEASURING TESTING
Information Patent Application
Frequency characteristics measuring method and device for accelerat...
- Publication number 20060179916
- Publication date Aug 17, 2006
- Akira Umeda
- G01 - MEASURING TESTING
Information Patent Application
Calibration evaluation method and device for acceleration sensor
- Publication number 20060010959
- Publication date Jan 19, 2006
- NAT. INST. OF ADVANCED INDUSTR. SCIENCE AND TECH.
- Akira Umeda
- G01 - MEASURING TESTING
Information Patent Application
Method and device for measuring dynamic linearity of acceleration s...
- Publication number 20050160785
- Publication date Jul 28, 2005
- Akira Umeda
- G01 - MEASURING TESTING

Akira Umeda

Person

Patents Grantslast 30 patents

Dynamic matrix sensitivity measuring instrument for inertial sensor...

Method of measuring transverse sensitivity of sensor for detecting...

Method and device for measuring dynamic linearity of acceleration s...

Method and apparatus for measuring frequency characteristics of acc...

Frequency characteristics measuring method and device for accelerat...

Calibration evaluation method and device for acceleration sensor

Patents Applicationslast 30 patents

Method of Measuring Transverse Sensitivity of Sensor for Detecting...

Method and apparatus for measuring frequency characteristics of acc...

Frequency characteristics measuring method and device for accelerat...

Calibration evaluation method and device for acceleration sensor

Method and device for measuring dynamic linearity of acceleration s...