Akira Watabe

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Higashiibaraki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle radiation apparatus, and method for displaying thr...
- Patent number 9,099,281
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and sample holder
- Patent number 8,878,144
- Issue date Nov 4, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holding apparatus for electron microscope, and electron micr...
- Patent number 8,835,847
- Issue date Sep 16, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device and sample holding device for electron beam de...
- Patent number 8,604,429
- Issue date Dec 10, 2013
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE HOLDING APPARATUS FOR ELECTRON MICROSCOPE, AND ELECTRON MICR...
- Publication number 20140042318
- Publication date Feb 13, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND SAMPLE HOLDER
- Publication number 20120305769
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Radiation Apparatus, and Method for Displaying Thr...
- Publication number 20120212583
- Publication date Aug 23, 2012
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM DEVICE AND SAMPLE HOLDING DEVICE FOR ELECTRON BEAM DE...
- Publication number 20110303845
- Publication date Dec 15, 2011
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS