Akira Yagi

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Sagamihara-shi, JP

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Patents Applicationslast 30 patents

Information Patent Application
COMPOUND MICROSCOPE WITH SCANNING PROBE MICROSCOPE AND OPTICAL MICR...
- Publication number 20150047080
- Publication date Feb 12, 2015
- OLYMPUS CORPORATION
- Akira YAGI
- G01 - MEASURING TESTING
Information Patent Application
Specimen stage array for scanning probe microscope
- Publication number 20070109636
- Publication date May 17, 2007
- OLYMPUS CORPORATION
- Akira Yagi
- G01 - MEASURING TESTING