Akira Yagi

Person

Sagamihara, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope using fluorescent light
- Patent number 5,986,256
- Issue date Nov 16, 1999
- Olympus Optical Co., Ltd.
- Akira Yagi
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope incorporating an optical microscope
- Patent number 5,952,562
- Issue date Sep 14, 1999
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanner system
- Patent number 5,835,251
- Issue date Nov 10, 1998
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning method with scanning probe microscope
- Patent number 5,652,377
- Issue date Jul 29, 1997
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanner system
- Patent number 5,526,165
- Issue date Jun 11, 1996
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling potentio-spectroscopic microscope and a data det...
- Patent number 5,378,983
- Issue date Jan 3, 1995
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 5,336,887
- Issue date Aug 9, 1994
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having cantilever and detecting sample ch...
- Patent number 5,289,004
- Issue date Feb 22, 1994
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for a scanning tunneling microscope
- Patent number D335888
- Issue date May 25, 1993
- Olympus Optical Co., Ltd.
- Takao Okada
- D16 - Photography and optical equipment
Information Patent Grant
Scanning tunneling potentio-spectroscopic microscope and a data det...
- Patent number 5,185,572
- Issue date Feb 9, 1993
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Barrier height measuring apparatus including a conductive cantileve...
- Patent number 5,168,159
- Issue date Dec 1, 1992
- Olympus Optical Co., Ltd.
- Akira Yagi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling spectroscope and a spectroscopic information det...
- Patent number 5,025,153
- Issue date Jun 18, 1991
- Olympus Optical Co., Ltd.
- Takao Okada
- B82 - NANO-TECHNOLOGY

Person

Patents Grantslast 30 patents

Scanning probe microscope using fluorescent light

Scanning probe microscope incorporating an optical microscope

Scanner system

Scanning method with scanning probe microscope

Scanner system

Scanning tunneling potentio-spectroscopic microscope and a data det...

Scanning probe microscope

Scanning probe microscope having cantilever and detecting sample ch...

Probe for a scanning tunneling microscope

Scanning tunneling potentio-spectroscopic microscope and a data det...

Barrier height measuring apparatus including a conductive cantileve...

Scanning tunneling spectroscope and a spectroscopic information det...