Akira Yasuhara

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Beam alignment method and electron microscope
- Patent number 10,020,162
- Issue date Jul 10, 2018
- Jeol Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and elemental mapping image generation method
- Patent number 9,627,175
- Issue date Apr 18, 2017
- Jeol Ltd.
- Masaki Morita
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Beam Alignment Method and Electron Microscope
- Publication number 20170301507
- Publication date Oct 19, 2017
- JEOL Ltd.
- Yuko Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Elemental Mapping Image Generation Method
- Publication number 20160111248
- Publication date Apr 21, 2016
- JEOL Ltd.
- Masaki Morita
- H01 - BASIC ELECTRIC ELEMENTS