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Akira Yonezawa

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  • Fussa, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electron microscope
    • Patent number 4,434,367
    • Issue date Feb 28, 1984
    • International Precision Incorporated
    • Akira Yonezawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Transmission electron microscope
    • Patent number 4,429,222
    • Issue date Jan 31, 1984
    • International Precision Incorporated
    • Akira Yonezawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Objective lens for electron microscope
    • Patent number 4,383,176
    • Issue date May 10, 1983
    • International Precision Incorporated
    • Akira Yonezawa
    • H01 - BASIC ELECTRIC ELEMENTS