Akira Yonezawa

Person

Koto, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus and contamination removal method th...
- Patent number 7,375,328
- Issue date May 20, 2008
- Holon Co., LTD
- Akira Yonezawa
- B08 - CLEANING
Information Patent Grant
Electron beam apparatus
- Patent number 6,949,745
- Issue date Sep 27, 2005
- SII NanoTechnology Inc.
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic field superimposed lens and electron beam device us...
- Patent number 6,897,450
- Issue date May 24, 2005
- SII NanoTechnology Inc.
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 6,740,888
- Issue date May 25, 2004
- SII NanoTechnology Inc.
- Mitsuyoshi Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electronic beam apparatus
- Patent number 6,617,579
- Issue date Sep 9, 2003
- Seiko Instruments Inc.
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus
- Patent number 6,504,164
- Issue date Jan 7, 2003
- Seiko Instruments Inc.
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making conductive bump on wiring board
- Patent number 6,351,885
- Issue date Mar 5, 2002
- Yamaichi Electronics Co., Ltd.
- Etsuji Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Objective lens for scanning electron microscope
- Patent number 6,335,530
- Issue date Jan 1, 2002
- Seiko Instruments Inc.
- Osamu Takaoka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming an interlayer connection structure
- Patent number 6,243,946
- Issue date Jun 12, 2001
- Yamaichi Electronics Co., Ltd.
- Etsuji Suzuki
- B30 - PRESSES
Information Patent Grant
Electron beam device
- Patent number 6,037,589
- Issue date Mar 14, 2000
- Seiko Instruments Inc.
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
IC package having a single wiring sheet with a lead pattern dispose...
- Patent number 5,973,395
- Issue date Oct 26, 1999
- Yamaichi Electronics Co., Ltd.
- Etsuji Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit board
- Patent number 5,950,306
- Issue date Sep 14, 1999
- Yamaichi Electronics Co., Ltd.
- Etsuji Suzuki
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Scanning electron beam microscope with high resolution at low accel...
- Patent number 5,241,176
- Issue date Aug 31, 1993
- Seiko Instruments Inc.
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 5,023,457
- Issue date Jun 11, 1991
- Seiko Instruments, Inc.
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron beam apparatus
- Patent number 4,961,003
- Issue date Oct 2, 1990
- Seiko Instruments, Inc.
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic electron lens
- Patent number 4,219,732
- Issue date Aug 26, 1980
- Nihon Denshi Kabushiki Kaisha
- Seiichi Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CABLE DEVICE AND METHOD OF PRODUCING THE SAME
- Publication number 20250024588
- Publication date Jan 16, 2025
- Yamaichi Electronics Co., Ltd.
- Takahiro SHIMOYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONNECTOR AND HIGH-FREQUENCY SIGNAL TRANSMISSION DEVICE
- Publication number 20240195127
- Publication date Jun 13, 2024
- Yamaichi Electronics Co., Ltd.
- Hiroshi TAKAHIRA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-FREQUENCY SIGNAL TRANSMISSION DEVICE AND HIGH-FREQUENCY SIGNAL...
- Publication number 20240172360
- Publication date May 23, 2024
- Yamaichi Electronics Co., Ltd.
- Hiroshi TAKAHIRA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
HIGH-FREQUENCY SIGNAL TRANSMISSION DEVICE AND ELECTRICAL CONNECTION...
- Publication number 20230402775
- Publication date Dec 14, 2023
- Yamaichi Electronics Co., Ltd.
- Takahiro SHIMOYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR GENERATING CHARGED P...
- Publication number 20100006756
- Publication date Jan 14, 2010
- Norimichi Anazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and contamination removal method th...
- Publication number 20060138363
- Publication date Jun 29, 2006
- HOLON CO., LTD.
- Akira Yonezawa
- B08 - CLEANING
Information Patent Application
Method for forming thin film and catalyzed treatment solution used...
- Publication number 20040067312
- Publication date Apr 8, 2004
- KANAGAWA UNIVERSITY
- Yuichi Sato
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
STRUCTURE OF CONDUCTIVE BUMP IN WIRING BOARD
- Publication number 20010015012
- Publication date Aug 23, 2001
- ETSUJI SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS

Akira Yonezawa

Person

Patents Grantslast 30 patents

Charged particle beam apparatus and contamination removal method th...

Electron beam apparatus

Electromagnetic field superimposed lens and electron beam device us...

Electron beam apparatus

Scanning electronic beam apparatus

Electron beam apparatus

Method of making conductive bump on wiring board

Objective lens for scanning electron microscope

Method of forming an interlayer connection structure

Electron beam device

IC package having a single wiring sheet with a lead pattern dispose...

Circuit board

Scanning electron beam microscope with high resolution at low accel...

Electron beam device

Scanning electron beam apparatus

Magnetic electron lens

Patents Applicationslast 30 patents

CABLE DEVICE AND METHOD OF PRODUCING THE SAME

CONNECTOR AND HIGH-FREQUENCY SIGNAL TRANSMISSION DEVICE

HIGH-FREQUENCY SIGNAL TRANSMISSION DEVICE AND HIGH-FREQUENCY SIGNAL...

HIGH-FREQUENCY SIGNAL TRANSMISSION DEVICE AND ELECTRICAL CONNECTION...

CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR GENERATING CHARGED P...

Charged particle beam apparatus and contamination removal method th...

Method for forming thin film and catalyzed treatment solution used...

STRUCTURE OF CONDUCTIVE BUMP IN WIRING BOARD