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Akira Yoshino
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Wakayama, JP
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last 30 patents
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Patent Grant
CDM simulator
Patent number
5,740,007
Issue date
Apr 14, 1998
Hanwa Electronic Ind. Co., Ltd.
Toshiyuki Nakaie
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Patent Grant
Apparatus for testing integrated circuit
Patent number
4,677,375
Issue date
Jun 30, 1987
Hanwa Electronic Co., Ltd.
Toshiyuki Nakaie
G01 - MEASURING TESTING