Akito Sasaki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for displaying measurement results from x-ray diffraction me...
- Patent number 10,801,976
- Issue date Oct 13, 2020
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for X-ray diffraction measurement data
- Patent number 8,971,492
- Issue date Mar 3, 2015
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus
- Patent number 7,711,091
- Issue date May 4, 2010
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing analysis using propagation rays and apparatus...
- Patent number 7,098,459
- Issue date Aug 29, 2006
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR DISPLAYING MEASUREMENT RESULTS FROM X-RAY DIFFRACTION ME...
- Publication number 20190064083
- Publication date Feb 28, 2019
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Application
OPERATION GUIDE SYSTEM FOR X-RAY ANALYSIS, OPERATION GUIDE METHOD T...
- Publication number 20170038315
- Publication date Feb 9, 2017
- Rigaku Corporation
- Akito SASAKI
- G01 - MEASURING TESTING
Information Patent Application
CRYSTALLINE PHASE IDENTIFICATION METHOD, CRYSTALLINE PHASE IDENTIFI...
- Publication number 20140278147
- Publication date Sep 18, 2014
- Rigaku Corporation
- Akito SASAKI
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD FOR X-RAY DIFFRACTION MEASUREMENT DATA
- Publication number 20130077754
- Publication date Mar 28, 2013
- Rigaku Corporation
- Akito SASAKI
- G01 - MEASURING TESTING
Information Patent Application
X-ray analysis apparatus
- Publication number 20080056452
- Publication date Mar 6, 2008
- Rigaku Corporation
- Akito Sasaki
- G01 - MEASURING TESTING
Information Patent Application
Method of performing analysis using propagation rays and apparatus...
- Publication number 20030231737
- Publication date Dec 18, 2003
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING