Akitoshi KAWAI

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement processing device, measurement processing method, measu...
- Patent number 11,016,039
- Issue date May 25, 2021
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, measurement processing method, measu...
- Patent number 11,016,038
- Issue date May 25, 2021
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, x-ray inspection device, measurement...
- Patent number 10,809,209
- Issue date Oct 20, 2020
- Nikon Corporation
- Hirotomo Yashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement processing device, x-ray inspection apparatus, method f...
- Patent number 10,760,902
- Issue date Sep 1, 2020
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, x-ray inspection apparatus, method f...
- Patent number 10,557,706
- Issue date Feb 11, 2020
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, x-ray inspection apparatus, method f...
- Patent number 10,502,562
- Issue date Dec 10, 2019
- Nikon Corporation
- Nobukatsu Machii
- G01 - MEASURING TESTING
Information Patent Grant
Measurement processing device, X-ray inspection device, measurement...
- Patent number 10,481,106
- Issue date Nov 19, 2019
- Nikon Corporation
- Hirotomo Yashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement processing device, X-ray inspection device, measurement...
- Patent number 10,444,165
- Issue date Oct 15, 2019
- Nikon Corporation
- Hirotomo Yashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Polarized light defect detection in pupil images
- Patent number 8,730,465
- Issue date May 20, 2014
- Nikon Corporation
- Kazumasa Endo
- G01 - MEASURING TESTING
Information Patent Grant
Polarized light defect detection in pupil images
- Patent number 8,599,370
- Issue date Dec 3, 2013
- Nikon Corporation
- Kazumasa Endo

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT...
- Publication number 20200003705
- Publication date Jan 2, 2020
- Nikon Corporation
- Hirotomo YASHIMA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, MEASU...
- Publication number 20190195811
- Publication date Jun 27, 2019
- Nikon Corporation
- Nobukatsu MACHII
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION APPARATUS, METHOD F...
- Publication number 20180372485
- Publication date Dec 27, 2018
- Nikon Corporation
- Nobukatsu MACHII
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT...
- Publication number 20180120243
- Publication date May 3, 2018
- Nikon Corporation
- Hirotomo YASHIMA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, MEASU...
- Publication number 20170241919
- Publication date Aug 24, 2017
- NOBUKATSU MACHII
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION APPARATUS, METHOD F...
- Publication number 20170176181
- Publication date Jun 22, 2017
- Nikon Corporation
- Nobukatsu MACHII
- G01 - MEASURING TESTING
Information Patent Application
Defect detecting apparatus and defect detecting method
- Publication number 20090147247
- Publication date Jun 11, 2009
- Nikon Corporation
- Kazumasa Endo
- G01 - MEASURING TESTING
Information Patent Application
Defect inspection apparatus performing defect inspection by image a...
- Publication number 20080285840
- Publication date Nov 20, 2008
- Nikon Corporation
- Akitoshi Kawai
- G06 - COMPUTING CALCULATING COUNTING

Akitoshi KAWAI

Person

Patents Grantslast 30 patents

Measurement processing device, measurement processing method, measu...

Measurement processing device, measurement processing method, measu...

Measurement processing device, x-ray inspection device, measurement...

Measurement processing device, x-ray inspection apparatus, method f...

Measurement processing device, x-ray inspection apparatus, method f...

Measurement processing device, x-ray inspection apparatus, method f...

Measurement processing device, X-ray inspection device, measurement...

Measurement processing device, X-ray inspection device, measurement...

Polarized light defect detection in pupil images

Polarized light defect detection in pupil images

Patents Applicationslast 30 patents

MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT...

MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, MEASU...

MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION APPARATUS, METHOD F...

MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION DEVICE, MEASUREMENT...

MEASUREMENT PROCESSING DEVICE, MEASUREMENT PROCESSING METHOD, MEASU...

MEASUREMENT PROCESSING DEVICE, X-RAY INSPECTION APPARATUS, METHOD F...

Defect detecting apparatus and defect detecting method

Defect inspection apparatus performing defect inspection by image a...