Akitoshi Toda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
SPM cantilever and fabricating method thereof
- Patent number 7,010,966
- Issue date Mar 14, 2006
- Olympus Corporation
- Masashi Kitazawa
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit and scanning microscope having the same
- Patent number 6,809,306
- Issue date Oct 26, 2004
- Olympus Optical Co., Ltd.
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Grant
Cantilever for scanning probe microscopy
- Patent number 6,694,805
- Issue date Feb 24, 2004
- Olympus Optical Co., Ltd.
- Koichi Shiotani
- G01 - MEASURING TESTING
Information Patent Grant
Scanning unit and scanning microscope having the same
- Patent number 6,617,761
- Issue date Sep 9, 2003
- Olympus Optical Co, Ltd.
- Toshio Ando
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope suitable for observing the sidewalls of s...
- Patent number 6,246,054
- Issue date Jun 12, 2001
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 5,859,364
- Issue date Jan 12, 1999
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanner system
- Patent number 5,835,251
- Issue date Nov 10, 1998
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope having an optical system for enabling ide...
- Patent number 5,675,145
- Issue date Oct 7, 1997
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanner system
- Patent number 5,526,165
- Issue date Jun 11, 1996
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated AFM sensor
- Patent number 5,386,720
- Issue date Feb 7, 1995
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of making cantilever chip for scanning probe microscope
- Patent number 5,386,110
- Issue date Jan 31, 1995
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever chip for scanning probe microscope
- Patent number 5,367,165
- Issue date Nov 22, 1994
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever chip for use in scanning probe microscope
- Patent number 5,319,961
- Issue date Jun 14, 1994
- Olympus Optical Co., Ltd.
- Katsuhiro Matsuyama
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe unit for near-field optical scanning microscope
- Patent number 5,294,790
- Issue date Mar 15, 1994
- Olympus Optical Co., Ltd.
- Yoshinori Ohta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Memory apparatus using tunnel current techniques
- Patent number 5,289,408
- Issue date Feb 22, 1994
- Olympus Optical Co., Ltd.
- Yoshiyuki Mimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever for a scanning probe microscope and a method of manufact...
- Patent number 5,272,913
- Issue date Dec 28, 1993
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Cantilever chip for scanning probe microscope having first and seco...
- Patent number 5,264,696
- Issue date Nov 23, 1993
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Atomic probe microscope and cantilever unit for use in the microscope
- Patent number 5,253,515
- Issue date Oct 19, 1993
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Integrated optical displacement sensor
- Patent number 5,247,186
- Issue date Sep 21, 1993
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Circuit pattern forming apparatus using MU-STM
- Patent number 5,216,254
- Issue date Jun 1, 1993
- Olympus Optical Co., Ltd.
- Hiroko Ohta
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Imaging apparatus having electrooptic devices comprising a variable...
- Patent number 5,150,234
- Issue date Sep 22, 1992
- Olympus Optical Co., Ltd.
- Susumu Takahashi
- G02 - OPTICS
Information Patent Grant
Apparatus including atomic probes utilizing tunnel current to read,...
- Patent number 5,144,581
- Issue date Sep 1, 1992
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring device in a scanning probe microscope
- Patent number 5,136,162
- Issue date Aug 4, 1992
- Olympus Optical Co., Ltd.
- Hirofumi Miyamoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Optical system including liquid crystal devices
- Patent number 5,097,352
- Issue date Mar 17, 1992
- Olympus Optical Co., Ltd.
- Susumu Takahashi
- G02 - OPTICS
Information Patent Grant
Memory device
- Patent number 5,091,880
- Issue date Feb 25, 1992
- Olympus Optical Co., Ltd.
- Yasuo Isono
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Imaging apparatus having electrooptic devices which comprise a vari...
- Patent number 5,071,229
- Issue date Dec 10, 1991
- Olympus Optical Co., Ltd.
- Yoshinao Oaki
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Tunnel current data storage apparatus having separate lever bodies
- Patent number 5,053,995
- Issue date Oct 1, 1991
- Olympus Optical Co., Ltd.
- Hiroshi Kajimura
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Endoscope using liquid crystal devices different in the response fr...
- Patent number 5,047,847
- Issue date Sep 10, 1991
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Atomic probe type microscope apparatus
- Patent number 5,047,637
- Issue date Sep 10, 1991
- Olympus Optical Co., Ltd.
- Akitoshi Toda
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Focused point detecting optical system
- Patent number 5,004,902
- Issue date Apr 2, 1991
- Olympus Optical Co., Ltd.
- Hiroshi Matsui
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
SPM cantilever and fabricating method thereof
- Publication number 20050160802
- Publication date Jul 28, 2005
- OLYMPUS CORPORATION
- Masashi Kitazawa
- G01 - MEASURING TESTING
Information Patent Application
SPM cantilever and fabricating method thereof
- Publication number 20040084737
- Publication date May 6, 2004
- OLYMPUS CORPORATION
- Masashi Kitazawa
- G01 - MEASURING TESTING
Information Patent Application
Scanning unit and scanning microscope having the same
- Publication number 20040065819
- Publication date Apr 8, 2004
- Olympus Optical Co., Ltd.
- Toshio Ando
- G02 - OPTICS
Information Patent Application
Cantilever for scanning probe microscopy
- Publication number 20020152804
- Publication date Oct 24, 2002
- Olympus Optical Co., Ltd.
- Koichi Shiotani
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning unit and scanning microscope having the same
- Publication number 20020017615
- Publication date Feb 14, 2002
- Olympus Optical Co., Ltd.
- Toshio Ando
- B82 - NANO-TECHNOLOGY

Akitoshi Toda

Person

Patents Grantslast 30 patents

SPM cantilever and fabricating method thereof

Scanning unit and scanning microscope having the same

Cantilever for scanning probe microscopy

Scanning unit and scanning microscope having the same

Scanning probe microscope suitable for observing the sidewalls of s...

Scanning probe microscope

Scanner system

Scanning probe microscope having an optical system for enabling ide...

Scanner system

Integrated AFM sensor

Method of making cantilever chip for scanning probe microscope

Cantilever chip for scanning probe microscope

Cantilever chip for use in scanning probe microscope

Probe unit for near-field optical scanning microscope

Memory apparatus using tunnel current techniques

Cantilever for a scanning probe microscope and a method of manufact...

Cantilever chip for scanning probe microscope having first and seco...

Atomic probe microscope and cantilever unit for use in the microscope

Integrated optical displacement sensor

Circuit pattern forming apparatus using MU-STM

Imaging apparatus having electrooptic devices comprising a variable...

Apparatus including atomic probes utilizing tunnel current to read,...

Measuring device in a scanning probe microscope

Optical system including liquid crystal devices

Memory device

Imaging apparatus having electrooptic devices which comprise a vari...

Tunnel current data storage apparatus having separate lever bodies

Endoscope using liquid crystal devices different in the response fr...

Atomic probe type microscope apparatus

Focused point detecting optical system

Patents Applicationslast 30 patents

SPM cantilever and fabricating method thereof

SPM cantilever and fabricating method thereof

Scanning unit and scanning microscope having the same

Cantilever for scanning probe microscopy

Scanning unit and scanning microscope having the same