Akiyoshi IRISAWA

Person

Miyagi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Light measurement apparatus, method, program and recording medium
- Patent number 9,846,120
- Issue date Dec 19, 2017
- Advantest Corporation
- Masaichi Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Light beam incident device and reflected light measurement device
- Patent number 9,568,422
- Issue date Feb 14, 2017
- Advantest Corporation
- Tomoyu Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Pulse light source, and method for stably controlling phase differe...
- Patent number 9,190,804
- Issue date Nov 17, 2015
- Advantest Corporation
- Tomoyu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic wave measurement device, measurement method, and re...
- Patent number 9,182,354
- Issue date Nov 10, 2015
- Advantest Corporation
- Eiji Kato
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 9,176,008
- Issue date Nov 3, 2015
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measurement device, measurement method, and re...
- Patent number 9,157,857
- Issue date Oct 13, 2015
- Advantest Corporation
- Shigeru Ono
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave detection device
- Patent number 8,901,477
- Issue date Dec 2, 2014
- Advantest Corporation
- Kazunori Shiota
- G01 - MEASURING TESTING
Information Patent Grant
Repetition frequency control device
- Patent number 8,718,108
- Issue date May 6, 2014
- Advantest Corporation
- Tomoyu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal output device, and output apparatus of signal source of sign...
- Patent number 8,676,061
- Issue date Mar 18, 2014
- Advantest Corporation
- Tomoyu Yamashita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electromagnetic wave emission device
- Patent number 8,642,984
- Issue date Feb 4, 2014
- Advantest Corporation
- Kazunori Shiota
- F21 - LIGHTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 8,493,057
- Issue date Jul 23, 2013
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Electromagnetic wave measuring apparatus, measuring method, program...
- Patent number 8,481,938
- Issue date Jul 9, 2013
- Advantest Corporation
- Shigeki Nishina
- G01 - MEASURING TESTING
Information Patent Grant
Light measurement apparatus and a trigger signal generator
- Patent number 8,399,835
- Issue date Mar 19, 2013
- Advantest Corporation
- Masaichi Hashimoto
- G01 - MEASURING TESTING
Information Patent Grant
Container, a method for disposing the same, and a measurement method
- Patent number 8,378,703
- Issue date Feb 19, 2013
- Advantest Corporation
- Akiyoshi Irisawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Repetition frequency control device
- Patent number 8,306,078
- Issue date Nov 6, 2012
- Advantest Corporation
- Tomoyu Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electromagnetic wave measuring apparatus, measurement method, a pro...
- Patent number 8,183,528
- Issue date May 22, 2012
- Advantest Corporation
- Eiji Kato
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, PROGRA...
- Publication number 20170074803
- Publication date Mar 16, 2017
- Advantest Corporation
- Fumikazu TAKAYANAGI
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, PROGRA...
- Publication number 20170074804
- Publication date Mar 16, 2017
- Advantest Corporation
- Fumikazu TAKAYANAGI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT MEASUREMENT APPARATUS, METHOD, PROGRAM AND RECORDING MEDIUM
- Publication number 20150241346
- Publication date Aug 27, 2015
- Advantest Corporation
- Masaichi HASHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
PULSE LIGHT SOURCE, AND METHOD FOR STABLY CONTROLLING PHASE DIFFERE...
- Publication number 20150194786
- Publication date Jul 9, 2015
- Advantest Corporation
- Tomoyu YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REFLECTION MEASUREMENT APPARATUS
- Publication number 20140168652
- Publication date Jun 19, 2014
- Advantest Corporation
- Tomoyu YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RE...
- Publication number 20140166883
- Publication date Jun 19, 2014
- Shigeru ONO
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE EMISSION DEVICE
- Publication number 20130284950
- Publication date Oct 31, 2013
- Advantest Corporation
- Kazunori SHIOTA
- G02 - OPTICS
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20130240736
- Publication date Sep 19, 2013
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
SPREAD ANALYSIS DEVICE FOR LUBRICANT, METHOD, AND RECORDING MEDIUM
- Publication number 20130126736
- Publication date May 23, 2013
- Advantest Corporation
- Eiji KATO
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE DETECTION DEVICE
- Publication number 20130075597
- Publication date Mar 28, 2013
- Advantest Corporation
- Kazunori SHIOTA
- G02 - OPTICS
Information Patent Application
ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RE...
- Publication number 20120286797
- Publication date Nov 15, 2012
- Advantest Corporation
- Eiji KATO
- G01 - MEASURING TESTING
Information Patent Application
REPETITION FREQUENCY CONTROL DEVICE
- Publication number 20120163404
- Publication date Jun 28, 2012
- Advantest Corporation
- Tomoyu YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REPETITION FREQUENCY CONTROL DEVICE
- Publication number 20120155500
- Publication date Jun 21, 2012
- Advantest Corporation
- Tomoyu YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL OUTPUT DEVICE, AND OUTPUT APPARATUS OF SIGNAL SOURCE OF SIGN...
- Publication number 20110170875
- Publication date Jul 14, 2011
- Advantest Corporation
- Tomoyu YAMASHITA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20110001048
- Publication date Jan 6, 2011
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...
- Publication number 20100295534
- Publication date Nov 25, 2010
- Advantest Corporation
- Shigeki NISHINA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT MEASUREMENT APPARATUS AND A TRIGGER SIGNAL GENERATOR
- Publication number 20100294934
- Publication date Nov 25, 2010
- Advantest Corporation
- Masaichi HASHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PRO...
- Publication number 20100271001
- Publication date Oct 28, 2010
- Advantest Corporation
- Eiji KATO
- G01 - MEASURING TESTING
Information Patent Application
CONTAINER, A METHOD FOR DISPOSING THE SAME, AND A MEASUREMENT METHOD
- Publication number 20100271056
- Publication date Oct 28, 2010
- Advantest Corporation
- Akiyoshi IRISAWA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Akiyoshi IRISAWA

Person

Patents Grantslast 30 patents

Light measurement apparatus, method, program and recording medium

Light beam incident device and reflected light measurement device

Pulse light source, and method for stably controlling phase differe...

Electromagnetic wave measurement device, measurement method, and re...

Electromagnetic wave measuring apparatus, measuring method, program...

Electromagnetic wave measurement device, measurement method, and re...

Electromagnetic wave detection device

Repetition frequency control device

Signal output device, and output apparatus of signal source of sign...

Electromagnetic wave emission device

Electromagnetic wave measuring apparatus, measuring method, program...

Electromagnetic wave measuring apparatus, measuring method, program...

Light measurement apparatus and a trigger signal generator

Container, a method for disposing the same, and a measurement method

Repetition frequency control device

Electromagnetic wave measuring apparatus, measurement method, a pro...

Patents Applicationslast 30 patents

ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, PROGRA...

ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, PROGRA...

LIGHT MEASUREMENT APPARATUS, METHOD, PROGRAM AND RECORDING MEDIUM

PULSE LIGHT SOURCE, AND METHOD FOR STABLY CONTROLLING PHASE DIFFERE...

REFLECTION MEASUREMENT APPARATUS

ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RE...

ELECTROMAGNETIC WAVE EMISSION DEVICE

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

SPREAD ANALYSIS DEVICE FOR LUBRICANT, METHOD, AND RECORDING MEDIUM

ELECTROMAGNETIC WAVE DETECTION DEVICE

ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RE...

REPETITION FREQUENCY CONTROL DEVICE

REPETITION FREQUENCY CONTROL DEVICE

SIGNAL OUTPUT DEVICE, AND OUTPUT APPARATUS OF SIGNAL SOURCE OF SIGN...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM...

LIGHT MEASUREMENT APPARATUS AND A TRIGGER SIGNAL GENERATOR

ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASUREMENT METHOD, A PRO...

CONTAINER, A METHOD FOR DISPOSING THE SAME, AND A MEASUREMENT METHOD