Alain Bismuth

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Beth Rimon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Measuring input capacitance with automatic test equipment (ATE)
- Patent number 11,662,372
- Issue date May 30, 2023
- Nuvoton Technology Corporation
- Alain Bismuth
- G01 - MEASURING TESTING
Information Patent Grant
Contact quality testing
- Patent number 11,187,746
- Issue date Nov 30, 2021
- Nuvoton Technology Corporation
- Alain Bismuth
- G01 - MEASURING TESTING
Information Patent Grant
Resolving automated test equipment (ATE) timing constraint violations
- Patent number 10,145,893
- Issue date Dec 4, 2018
- Nuvoton Technology Corporation
- Josef Nevo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Reliable Programming of One-Time Programmable (OTP) Memory During D...
- Publication number 20240412806
- Publication date Dec 12, 2024
- Nuvoton Technology Corporation
- Ziv Hershman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measuring Input Capacitance with Automatic Test Equipment (ATE)
- Publication number 20210382101
- Publication date Dec 9, 2021
- Nuvoton Technology Corporation
- Alain Bismuth
- G01 - MEASURING TESTING
Information Patent Application
Measuring Input Capacitance with Automatic Test Equipment (ATE)
- Publication number 20210041488
- Publication date Feb 11, 2021
- Nuvoton Technology Corporation
- Alain Bismuth
- G01 - MEASURING TESTING
Information Patent Application
Contact Quality Testing
- Publication number 20200309850
- Publication date Oct 1, 2020
- Nuvoton Technology Corporation
- Alain Bismuth
- G01 - MEASURING TESTING
Information Patent Application
Slew Rate Programming in Automatic Test Equipment (ATE)
- Publication number 20200256914
- Publication date Aug 13, 2020
- Nuvoton Technology Corporation
- Alain Bismuth
- G01 - MEASURING TESTING
Information Patent Application
RESOLVING AUTOMATED TEST EQUIPMENT (ATE) TIMING CONSTRAINT VIOLATIONS
- Publication number 20180180667
- Publication date Jun 28, 2018
- Nuvoton Technology Corporation
- Josef Nevo
- G01 - MEASURING TESTING